Inventor
Hendrikus Petrus Elisabeth Vranken
Inventor
Weert, NL
Overview
Patents· 8 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables88%
G06FElectric digital data processing13%
PatentTitleYear
9,041,411'Testing of an integrated circuit that contains secret information'20158,539,292'Testing of an integrated circuit that contains secret information'20138,281,197'Integrated circuit test method and test apparatus'20127,945,828'Integrated circuit arrangement and design method'20117,558,994'Methods and apparatus for data compression'20097,376,873'Method and system for selectively masking test responses'20087,293,258'Data processor and method for using a data processor with debug circuit'20077,124,340'Low pin count, high-speed boundary scan testing'2006Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2006–2009Based in Eindhoven, NL· patent location history
2007–2015Patents assigned to NXP BV (7)· patent assignee history
2011–2015Based in Weert, NL· patent location history
2013–2015Patents assigned to MARINISSEN ERIK J (2)· patent assignee history
2013–2015Patents assigned to NIEUWLAND ANDRE K (2)· patent assignee history
2013–2015Patents assigned to VRANKEN HENDRIKUS P E (2)· patent assignee history
2015Patents assigned to GOEL SANDEEP KUMAR (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| NXP BV | 7 | 2007–2015 |
| MARINISSEN ERIK J | 2 | 2013–2015 |
| NIEUWLAND ANDRE K | 2 | 2013–2015 |
| VRANKEN HENDRIKUS P Eself | 2 | 2013–2015 |
| GOEL SANDEEP KUMAR | 1 | 2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| Weert, NL | 4 | 2011–2015 |
| Eindhoven, NL | 4 | 2006–2009 |