Inventor
Gabriel BARALIA
Inventor
DE
Overview
Patents· 3 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Qprimary
G01QScanning-probe techniques or apparatus30%
H01JElectric discharge tubes or discharge lamps30%
G01NInvestigating or analysing materials by determining their chemical or physical properties10%
G02BOptical elements, systems or apparatus10%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices10%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1010%
PatentTitleYear
11,977,097Methods and devices for extending a time period until changing a measuring tip of a scanning probe microscope202411,733,186Device and method for analyzing a defect of a photolithographic mask or of a wafer202311,353,478Methods and devices for extending a time period until changing a measuring tip of a scanning probe microscope2022Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2022–2024Patents assigned to ZEISS CARL SMT GMBH (3)· patent assignee history
2022–2024Based in DE· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ZEISS CARL SMT GMBH | 3 | 2022–2024 |
Locations
| Location | Patents | Span |
|---|---|---|
| DE | 3 | 2022–2024 |