Inventor
Keiichiro Hitomi
Inventor
Delmar, NY, US
Overview
Patents· 11 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Jprimary
H01JElectric discharge tubes or discharge lamps43%
B82YSpecific uses or applications of nanostructures10%
G01BMeasuring length, thickness or similar linear dimensions10%
G06FElectric digital data processing10%
G01NInvestigating or analysing materials by determining their chemical or physical properties5%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices5%
H04LTransmission of digital information, e.g. telegraphic communication5%
H04NPictorial communication, e.g. television5%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h105%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h105%
PatentTitleYear
10,546,017Displaying terms having corresponding character strings on a display202010,416,940Image processing apparatus, image processing system, and image processing method for interpreting content obtained from a web browser and displaying a screen based on the interpreted content20199,200,896'Pattern dimension measurement method and charged particle beam microscope used in same'20159,110,384'Scanning electron microscope'20158,637,820'Scanning electron microscope and inspection method using same'20148,478,021'Charged beam device'20138,263,929'Standard member for correction, scanning electron microscope using same, and scanning electron microscope correction method'20127,875,850'Standard component for calibration and electron-beam system using the same'20117,750,296'Scanning electron microscope and calibration of image distortion'20107,683,313'Charged particle beam measurement equipment, size correction and standard sample for correction'20107,612,334'Standard reference component for calibration, fabrication method for the same, and scanning electron microscope using the same'2009Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2009–2015Patents assigned to HITACHI HIGH TECH CORP (9)· patent assignee history
2009–2011Based in Kokubunji, JP· patent location history
2012–2020Patents assigned to HITOMI KEIICHIRO (7)· patent assignee history
2012–2015Patents assigned to NAKAYAMA YOSHINORI (4)· patent assignee history
2012–2014Patents assigned to SOHDA YASUNARI (3)· patent assignee history
2012–2015Based in Delmar, NY, US· patent location history
2019–2020Patents assigned to RICOH CO LTD (2)· patent assignee history
2019–2020Based in Kanagawa, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HITACHI HIGH TECH CORP | 9 | 2009–2015 |
| HITOMI KEIICHIROself | 7 | 2012–2020 |
| NAKAYAMA YOSHINORI | 4 | 2012–2015 |
| SOHDA YASUNARI | 3 | 2012–2014 |
| RICOH CO LTD | 2 | 2019–2020 |
Locations
| Location | Patents | Span |
|---|---|---|
| Delmar, New York, US | 5 | 2012–2015 |
| Kokubunji, JP | 4 | 2009–2011 |
| Kanagawa, JP | 2 | 2019–2020 |