Inventor
YOSHINORI FUJIWARA
Inventor
US
Overview
Patents· 23 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G11Cprimary
G11CStatic stores61%
G06FElectric digital data processing19%
H03KPulse technique14%
H01LSemiconductor devices3%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h103%
PatentTitleYear
12,580,036Apparatuses and methods for forcing memory cell failures in a memory device202612,394,456Apparatuses and methods including dice latches in a semiconductor device202512,394,501Apparatus with adjustable diagnostic mechanism and methods for operating the same202512,354,694Apparatuses and methods for dynamic column select swapping202512,100,467Systems and methods for testing redundant fuse latches in a memory device202412,100,476Test mode security circuit202412,079,076Apparatuses, systems, and methods for error correction202412,061,795Repair element availability communication202411,955,160Asynchronous signal to command timing calibration for testing accuracy202411,915,775Apparatuses and methods for bad row mode202411,791,011Self-repair verification202311,783,909Systems and methods for power savings in row repaired memory202311,742,044Memory built-in self-test with adjustable pause time202311,727,967Apparatuses and methods including dice latches in a semiconductor device202311,705,214Apparatuses and methods for self-test mode abort circuit202311,670,356Apparatuses and methods for refresh address masking202311,645,134Apparatuses and methods for fuse error detection202311,417,411Systems and methods for power savings in row repaired memory202211,410,742Microelectronic device testing, and related devices, systems, and methods202211,342,042Interconnected command/address resources202211,263,078Apparatuses, systems, and methods for error correction202211,183,260Transmit line monitoring circuitry, and related methods, devices, and systems202111,170,837Identifying high impedance faults in a memory device2021Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2021–2026Patents assigned to MICRON TECHNOLOGY INC (23)· patent assignee history
2021Patents assigned to MICRON TECH (1)· patent assignee history
2021–2026Based in US· patent location history
2024Patents assigned to MICRON TECHNOLGY INC (1)· patent assignee history
2025Patents assigned to MICRON ECHNOLOGY INC (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| MICRON TECHNOLOGY INC | 23 | 2021–2026 |
| MICRON ECHNOLOGY INC | 1 | 2025 |
| MICRON TECH | 1 | 2021 |
| MICRON TECHNOLGY INC | 1 | 2024 |
Locations
| Location | Patents | Span |
|---|---|---|
| US | 23 | 2021–2026 |