Inventor

Kevin M. Mcilvain

Inventor
Delmar, NY, US

Overview

23→
Patents
2007–2021
Patent span
Physics
Primary field (CPC G)

Patents· 23 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G06Fprimary
G06FElectric digital data processing50%
G11CStatic stores26%
Y02DClimate change mitigation technologies in information and communication technologies [ict], i.e. information and communication technologies aiming at the reduction of their own energy use13%
G05DSystems for controlling or regulating non-electric variables7%
H01LSemiconductor devices4%
PatentTitleYear
11,119,676Using spare bits in memory systems202111,037,619Using dual channel memory as single channel memory with spares202110,671,497Efficient and selective sparing of bits in memory systems202010,642,504Thermal and power memory actions202010,606,696Internally-generated data storage in spare memory locations202010,606,713Using dual channel memory as single channel memory with command address recovery202010,585,754Memory security protocol202010,546,628Using dual channel memory as single channel memory with spares202010,394,618Thermal and power memory actions201910,353,455Power management in multi-channel 3D stacked DRAM201910,338,815Multi-channel nonvolatile memory power loss management201910,281,974Power management in multi-channel 3D stacked DRAM201910,261,856Bitwise sparing in a memory system201910,198,300Thermal and power memory actions201910,168,905Multi-channel nonvolatile memory power loss management201910,127,100Correcting a data storage error caused by a broken conductor using bit inversion201810,042,726Data buffer spare architectures for dual channel serial interface memories20189,904,611'Data buffer spare architectures for dual channel serial interface memories'20189,740,267'Adjusting power management controls of a memory based on traffic'20179,384,108'Functional built-in self test for a chip'20167,356,793'Genie: a method for classification and graphical display of negative slack timing test failures'20087,305,644'Negative slack recoverability factor—a net weight to enhance timing closure behavior'20077,290,233'Method for netlist path characteristics extraction'2007

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2007–2021Patents assigned to IBM (23)· patent assignee history
2007–2008Based in Cold Spring, NY, US· patent location history
2016–2021Based in Delmar, NY, US· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
IBM232007–2021
Locations
LocationPatentsSpan
Delmar, New York, US202016–2021
Cold Spring, New York, US32007–2008