Inventor
Hidehiko Kuroda
Inventor
Yokohama, JP
Overview
Patents· 31 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G21Cprimary
G21CNuclear reactors14%
Y02EReduction of greenhouse gas [ghg] emissions, related to energy generation, transmission or distribution14%
G01NInvestigating or analysing materials by determining their chemical or physical properties11%
G01BMeasuring length, thickness or similar linear dimensions8%
F22BMethods of steam generation7%
G01HMeasurement of mechanical vibrations or ultrasonic, sonic or infrasonic waves5%
G01TMeasurement of nuclear or x-radiation5%
H03GControl of amplification4%
G01LMeasuring force, stress, torque, work, mechanical power, mechanical efficiency, or fluid pressure3%
G05FSystems for regulating electric or magnetic variables3%
PatentTitleYear
10,935,961Working system202110,175,471Imaging device including a control unit configured to counteract vibration201910,102,934Reactor state monitoring apparatus and monitoring method thereof20189,927,536'Radiation detection apparatus and radiation detection method'20189,910,163'Alpha ray observation device and alpha ray observation method'20189,625,273'Thickness measurement apparatus and method thereof'20179,557,208'Liquid level measuring apparatus, method, and program'20179,523,776'Radiation detector and radiation detection method'20169,285,264'Vibration measuring apparatus for nuclear reactor internal structure and vibration measurement method therefor'20169,279,889'Light detection unit and alpha ray observation device'20169,099,206'Nuclear reactor vibration monitoring device and monitoring method thereof'20158,774,340'Nuclear reactor vibration surveillance system and its method'20148,497,986'Laser-based maintenance apparatus using ultrasonic wave detection for flaw analysis and repair'20138,248,595'Laser-based maintenance apparatus for inspecting flaws based on a generated surface wave'20128,115,936'Laser ultrasonic detection device including a laser oscillating device which includes a seed laser oscillating element'20128,094,297'Laser-based maintenance apparatus for inspecting flaws'20127,888,978'Frequency synthesizer'20117,728,967'Laser-based maintenance apparatus'20107,671,682'Variable gain power amplifier'20107,594,644'Semiconductor device and method for manufacturing the same, circuit board, electronic apparatus, and semiconductor device manufacturing apparatus'20097,104,133'Torsional vibration measuring instrument'20066,998,704'Semiconductor device and method for manufacturing the same, circuit board, electronic apparatus, and semiconductor device manufacturing apparatus'20066,509,798'Variable gain amplifier'20036,460,422'Device for calculating a torque of a rotating member'20026,384,668'Charge pump circuit'20026,326,842'Variable gain amplifying apparatus which can change a gain during an operation'20016,087,819'Current mirror circuit with minimized input to output current error'20006,008,655'Frequency divider testing circuit clock-sampling window variable with divider output'19995,974,860'Oil detecting system'19995,926,062'Reference voltage generating circuit'19995,875,042'Image scanner'1999Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1999–2018Patents assigned to TOSHIBA KK (18)· patent assignee history
1999–2019Patents assigned to NEC CORP (9)· patent assignee history
1999–2018Based in Yokohama, JP· patent location history
1999–2019Based in Tokyo, JP· patent location history
2006–2015Based in Kanagawa, JP· patent location history
2012–2017Patents assigned to KURODA HIDEHIKO (8)· patent assignee history
2012–2013Patents assigned to MIURA TAKAHIRO (4)· patent assignee history
2012–2013Patents assigned to OCHIAI MAKOTO (4)· patent assignee history
2021Based in Toyota, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TOSHIBA KK | 18 | 1999–2018 |
| NEC CORP | 9 | 1999–2019 |
| KURODA HIDEHIKOself | 8 | 2012–2017 |
| MIURA TAKAHIRO | 4 | 2012–2013 |
| OCHIAI MAKOTO | 4 | 2012–2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Yokohama, JP | 15 | 1999–2018 |
| Tokyo, JP | 10 | 1999–2019 |
| Kanagawa, JP | 5 | 2006–2015 |
| Toyota, JP | 1 | 2021 |