Inventor
Shinichiro Aoshima
Inventor
Shizuoka, JP
Overview
Patents· 73 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables38%
H01SDevices using the process of light amplification by stimulated emission of radiation [laser] to amplify or generate light18%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light6%
G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein6%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests5%
G01NInvestigating or analysing materials by determining their chemical or physical properties4%
G02BOptical elements, systems or apparatus4%
B23KSoldering or unsoldering3%
H04BTransmission3%
G04FTime-interval measuring2%
PatentTitleYear
8,947,771'Optical amplifying device'20158,872,067'Laser beam working machine'20148,841,580'Laser beam working machine'20148,742,353'Single terahertz wave time-waveform measuring device'20148,415,625'Total reflection terahertz wave measurement device'20138,354,644'Total reflection tera hertz wave measuring apparatus'20137,046,360'Image pickup device'20067,046,365'Light track observing device'20067,002,162'Instrument for measuring lifetime of fluorescene'20066,707,021'Transparent medium processing device'20045,815,519'Ultrashort pulse laser apparatus'19985,751,419'Optical delay apparatus'19985,703,491'Voltage detection apparatus'19975,592,101'Electro-optic apparatus for measuring an electric field of a sample'19975,585,044'Liquid treating method and liquid treating apparatus'19965,583,444'Voltage detection apparatus'19965,552,716'Method of positioning an electrooptic probe of an apparatus for the measurement of voltage'19965,546,011'Voltage measuring apparatus'19965,500,587'E-O probe'19965,499,190'System for measuring timing relationship between two signals'19965,479,106'Electro-optic voltage detector'19955,444,365'Voltage measuring apparatus having an electro-optic member'19955,420,686'Polarization interferometer optical voltage detector utilizing movement of interference fringe'19955,384,638'Sampling-type optical voltage detector utilizing movement of interference fringe'19955,382,789'Near field scanning optical microscope'19955,357,532'Wavelength variable laser device'19945,350,913'Light pulse intensity regenerator, light tranforming repeater, pre-amplifier for light signal, light intensity change measuring apparatus, and stabilized light source'19945,319,654'Pulsed laser beam source device'19945,317,577'Optical wavelength shifter using nonlinear refractive medium disposed interiorly of laser resonator'19945,307,199'Optical apparatus'19945,289,114'Voltage detection apparatus using short pulse light source with narrow spectral band width'19945,237,388'Polarized light measuring apparatus and phase plate measuring apparatus'19935,220,579'Pulse laser'19935,198,921'Light amplifying polarizer'19935,179,565'Low noise pulsed light source utilizing laser diode and voltage detector device utilizing same low noise pulsed light source'19935,164,667'Voltage detecting device'19925,153,667'Apparatus for detecting the change of light intensity'19925,121,404'Optically pumped solid laser'19925,119,385'Parametric pulse laser'19925,082,340'Wavelength converting device'19925,077,745'Mode-locked solid-state ring laser'19915,055,770'Method and apparatus for detecting voltage'19915,043,568'Optical signal detector incorporating means for eluminating background light'19915,034,683'Voltage detecting device'19915,025,142'Light waveform changing apparatus using an optical amplifier'19914,996,475'Electro-optic voltage detector having a transparent electrode'19914,994,663'Light intensity correlating apparatus'19914,988,859'Optical waveform measuring device'19914,982,152'Voltage detecting device'19914,982,151'Voltage measuring apparatus'19914,980,632'Electrical signal observing device'19904,975,635'Voltage detector using a sampling type high-speed photodetector'19904,973,900'Voltage detecting device'19904,968,881'Voltage detector using electro-optic material having anti-reflective coatings'19904,967,144'Electrical signal observing device for converting an electrical signal to be measured into an optical intensity waveform'19904,962,353'Voltage detector'19904,958,354'Apparatus for stabilizing the intensity of light'19904,958,124'Multi-channel voltage detector'19904,922,186'Voltage detector'19904,920,310'Voltage detector'19904,909,628'Optical heterodyne detector'19904,906,922'Voltage mapping device having fast time resolution'19904,891,579'Voltage detector'19904,887,026'Voltage detector for detecting a voltage developing in a selected area of an object'19894,866,721'Pulsed laser stabilizing device'19894,866,372'Voltage detector having compensation for polarization change caused by spontaneous birefringence'19894,864,220'Voltage detector using electro-optic material and interference of light beams'19894,864,222'Voltage detector employing electro-optic material having a corner-cube shape'19894,864,577'Highly repetitively pulsed laser device'19894,855,591'Electro-optical voltage detector'19894,841,234'Voltage detector utilizing an optical probe of electro-optic material'19894,796,992'Apparatus for optically analyzing an object using four-wave mixing technique'19894,760,577'CPM pulse laser device having a feedback means'1988Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1988–2015Patents assigned to HAMAMATSU PHOTONICS KK (72)· patent assignee history
1988–1995Based in Shizuoka, JP· patent location history
1990–2015Patents assigned to TAKAHASHI HIRONORI (5)· patent assignee history
1990–2015Based in Hamamatsu, JP· patent location history
1993–1997Based in Iwata, JP· patent location history
2013–2015Patents assigned to AOSHIMA SHINICHIRO (6)· patent assignee history
2013–2014Patents assigned to AOSHIMA ATSUKO (4)· patent assignee history
2013–2015Patents assigned to KAWADA YOICHI (4)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HAMAMATSU PHOTONICS KK | 72 | 1988–2015 |
| AOSHIMA SHINICHIROself | 6 | 2013–2015 |
| TAKAHASHI HIRONORI | 5 | 1990–2015 |
| AOSHIMA ATSUKO | 4 | 2013–2014 |
| KAWADA YOICHI | 4 | 2013–2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| Shizuoka, JP | 40 | 1988–1995 |
| Hamamatsu, JP | 30 | 1990–2015 |
| Iwata, JP | 3 | 1993–1997 |