Inventor
William J. Hurley
Inventor
Poughkeepsie, NY, US
Overview
Patents· 8 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables56%
G06FElectric digital data processing22%
G11CStatic stores22%
PatentTitleYear
7,930,601'AC ABIST diagnostic method, apparatus and program product'20117,475,308'implementing deterministic based broken scan chain diagnostics'20097,395,469'Method for implementing deterministic based broken scan chain diagnostics'20087,395,470'Method, apparatus, and computer program product for diagnosing a scan chain failure employing fuses coupled to the scan chain'20087,392,449'Method, apparatus, and computer program product for diagnosing a scan chain failure employing fuses coupled to the scan chain'20087,225,374'ABIST-assisted detection of scan chain defects'20077,117,415'Automated BIST test pattern sequence generator software system and method'20063,961,251'Testing embedded arrays'1976Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1976–2011Patents assigned to IBM (8)· patent assignee history
1976–2009Based in Poughkeepsie, NY, US· patent location history
2011Based in Walpole, MA, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IBM | 8 | 1976–2011 |
Locations
| Location | Patents | Span |
|---|---|---|
| Poughkeepsie, New York, US | 7 | 1976–2009 |
| Walpole, Massachusetts, US | 1 | 2011 |