Inventor
Clinton L. Lingren
Inventor
San Diego, CA, US
Overview
Patents· 20 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Tprimary
G01TMeasurement of nuclear or x-radiation33%
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation20%
G01NInvestigating or analysing materials by determining their chemical or physical properties14%
A61BDiagnosis12%
H04NPictorial communication, e.g. television12%
G21CNuclear reactors4%
Y02EReduction of greenhouse gas [ghg] emissions, related to energy generation, transmission or distribution4%
G01DMeasuring not specially adapted for a specific variable2%
PatentTitleYear
9,518,941'Weight-percent analysis for prompt gamma neutron activation substance analyzers'20169,500,605'Prompt gamma neutron activation substance analyzers'20169,291,580'Prompt gamma neutron activation substance analyzers'20167,778,783'Method and apparatus for analysis of elements in bulk substance'20107,152,002'Method and apparatus for analysis of elements in bulk substance'20066,541,763'Semiconductor gamma-ray camera and medical imaging system'20036,333,504'Semiconductor radiation detector with enhanced charge collection'20016,194,715'Semiconductor gamma-ray camera and medical imaging system'20016,172,362'Semiconductor gamma-ray camera and medical imaging system'20016,091,070'Semiconductor gamma- ray camera and medical imaging system'20006,046,454'Semiconductor radiation detector with enhanced charge collection'20006,037,595'Radiation detector with shielding electrode'20006,002,134'Cross-strip semiconductor detector with cord-wood construction'19995,847,396'Semiconductor gamma-ray camera and medical imaging system'19985,786,597'Semiconductor gamma-ray camera and medical imaging system'19985,677,539'Semiconductor radiation detector with enhanced charge collection'19974,694,165'Bulk material analyzer calibration block'19874,582,992'Self-contained, on-line, real-time bulk material analyzer'19864,568,514'Fission chamber detector system for monitoring neutron flux in a nuclear reactor over an extra wide range, with high sensitivity in a hostile environment'19864,495,144'Fission chamber detector system for monitoring neutron flux in a nuclear reactor over an extra wide range, with high sensitivity in a hostile environment'1985Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1985–1987Patents assigned to GAMMA METRICS (4)· patent assignee history
1985–2016Based in San Diego, CA, US· patent location history
1997Patents assigned to DIGIRAD INC (1)· patent assignee history
1998–2003Patents assigned to DIGIRAD CORP (10)· patent assignee history
2006–2016Patents assigned to SABIA INC (5)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| DIGIRAD CORP | 10 | 1998–2003 |
| SABIA INC | 5 | 2006–2016 |
| GAMMA METRICS | 4 | 1985–1987 |
| DIGIRAD INC | 1 | 1997 |
Locations
| Location | Patents | Span |
|---|---|---|
| San Diego, California, US | 20 | 1985–2016 |