LexDanaLexDanabeta
Inventor

Katsuhiko Kobayashi

Inventor
Tokyo, JP

Overview

52→
Patents
1987–2020
Patent span
Human necessities
Primary field (CPC A)

Patents· 52 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

A61Bprimary
A61BDiagnosis28%
H01RElectrically-conductive connections16%
A61FFilters implantable into blood vessels6%
B82YSpecific uses or applications of nanostructures5%
C09KMaterials for miscellaneous applications, not provided for elsewhere5%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices5%
G06KGraphical data reading5%
H01JElectric discharge tubes or discharge lamps5%
C07CAcyclic or carbocyclic compounds4%
G06VImage or video recognition or understanding2%
PatentTitleYear
10,784,605Connector with a contact retained in a housing202010,614,278Biometric collection device202010,505,302Connector201910,418,734Contact assembly for a straddle mount connector20199,870,499'Biometric collection device'20189,610,732'Lamination molding apparatus'20179,558,380'Card connector'20179,083,117'Card connector'20158,451,010'Coupon board and manufacturing method of printed board'20138,123,544'Electrical connector assembly adapted to withstand rotational movement'20127,985,096'Connector with switch'20117,628,636'Electrical connector'20097,438,601'Connector'20087,261,416'Eye\'s optical characteristics measuring system'20077,244,025'Eye\'s optical characteristics measuring system'20077,011,411'Eye\'s optical characteristic measuring system'20066,824,269'Eye\'s optical characteristic measuring system'20046,789,899'Eye\'s optical characteristic measuring system'20046,746,265'Electrical connector assembly and male connector used in the same'20046,699,238'Laser operating system'20046,676,258'Eye characteristic measurement apparatus with speckle noise reduction'20046,634,899'Card edge connector'20036,623,117'Eye\'s optical characteristic measuring system'20036,565,210'Ocular optical characteristic measuring apparatus'20036,413,109'Card edge connector having a ground contact'20026,273,566'Ophthalmologic characteristic measuring apparatus'20016,231,785'Benzene derivative and its production method'20016,222,195'Charged-particle-beam exposure device and charged-particle-beam exposure method'20016,210,399'Noncontact laser microsurgical method'20016,187,223'Polyhaloalkyl ether derivatives as well as liquid crystal compositions and liquid crystal display elements containing them'20016,176,725'Card edge connector'20016,137,111'Charged particle-beam exposure device and charged-particle-beam exposure method'20006,042,233'Optical characteristic measuring apparatus'20006,007,740'Polyhaloalkyl ether derivatives as well as liquid crystal compositions and liquid crystal display elements containing them'19995,961,881'Liquid crystal composition and liquid crystal display element'19995,865,830'Noncontact laser microsurgical apparatus'19995,863,213'Memory card connector and adapter therefor'19995,830,612'Method of detecting a deficiency in a charged-particle-beam exposure mask'19985,774,615'Optical fiber with a metal layer to maintain the desired shape of the optical fiber'19985,633,694'Ophthalmometric apparatus for generating an image of a selection and a surface of an eyeground of a subject'19975,546,142'Method and apparatus of optometry'19965,391,886'Charged particle beam exposure system and method of exposing a pattern on an object by such a charged particle beam exposure system'19955,329,676'Buckle device of seat belt unit and method for connecting buckle cover in said buckle device'19945,281,211'Noncontact laser microsurgical apparatus'19945,152,759'Noncontact laser microsurgical apparatus'19924,943,512'Photocurable and dyeable resin composition with bisazide and dyeable acrylic copolymer'19904,848,899'Fixation sight apparatus for ophthalmologic instrument'19894,834,527'Working distance alignment optical system for ophthalmological instrument'19894,817,620'Noncontact type tonometer'19894,740,071'Subjective ophthalmic instrument'19884,676,612'Eye examining apparatus'19874,665,923'Non-contact type tonometer'1987

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1987–1989Patents assigned to TOKYO OPTICAL (6)· patent assignee history
1987–2015Based in Tokyo, JP· patent location history
1990–2001Patents assigned to CHISSO CORP (5)· patent assignee history
1992–2001Based in Chiba, JP· patent location history
1995–2013Patents assigned to FUJITSU LTD (5)· patent assignee history
1995–2019Based in Kawasaki, JP· patent location history
1996–2007Patents assigned to TOPCON CORP (14)· patent assignee history
1999–2012Based in Yamanashi, JP· patent location history
2011–2020Patents assigned to TYCO ELECTRONICS JAPAN G K (7)· patent assignee history
2017–2020Based in Kanagawa, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
TOPCON CORP141996–2007
TYCO ELECTRONICS JAPAN G K72011–2020
TOKYO OPTICAL61987–1989
CHISSO CORP51990–2001
FUJITSU LTD51995–2013
Locations
LocationPatentsSpan
Tokyo, JP181987–2015
Chiba, JP71992–2001
Kawasaki, JP61995–2019
Yamanashi, JP61999–2012
Kanagawa, JP42017–2020