Inventor
Pawel Drabarek
Inventor
Tiefenbronn, DE
Overview
Patents· 29 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions66%
G01DMeasuring not specially adapted for a specific variable9%
G02BOptical elements, systems or apparatus9%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light6%
G01CMeasuring distances, levels or bearings3%
G01HMeasurement of mechanical vibrations or ultrasonic, sonic or infrasonic waves3%
G01NInvestigating or analysing materials by determining their chemical or physical properties3%
G01PMeasuring linear or angular speed, acceleration, deceleration, or shock3%
PatentTitleYear
9,841,273'Optical measuring probe and method for optically measuring inner diameters'20179,360,305'Tactile microprobe arm fastened to freestanding end of an optical fiber'20168,913,249'Optical system for illuminating a measured object and interferometric system for measuring surfaces of a measured object'20148,830,482'Interferometric path and/or rotation measuring device'20148,077,323'Optical fiber probe for an interferometric measuring device and method for manufacturing an optical fiber probe'20117,522,793'Coupling device for a light guide'20097,518,729'Interferometric measuring device'20097,400,408'Interferometric measuring device'20087,339,679'Interferometric measuring device utilizing a slanted probe filter'20087,187,450'Interferometric measuring device'20077,046,369'Interferometric measuring method and device for measuring the shape of or the distance to surfaces'20066,813,029'Interferometric measuring device for form measurement'20046,741,355'Short coherence fiber probe interferometric measuring device'20046,724,485'Interferometric measuring device for determining the profile or the pitch of especially rough surfaces'20046,490,046'Modulation interferometer and fiberoptically divided measuring probe with light guided'20026,462,815'Device for optically testing surfaces'20026,297,884'Interferometric instrument provided with an arrangement for producing a frequency shift between two interfering beam components'20016,295,132'Interferometric measuring device having parallelly-displacing arrangement and compensating grating in the reference path'20016,252,669'Interferometric instrument provided with an arrangement for producing a frequency shift between two interfering beam components'20016,243,169'Interferometric instrument provided with an arrangement for periodically changing a light path of a received beam component'20016,188,480'Interferometric measurement of positions, position changes, and physical quantities derived therefrom'20016,100,979'Arrangement for the testing of surfaces'20006,064,482'Interferometric measuring device for form measurement on rough surfaces'20005,933,237'Interferometric instrument'19995,883,715'Laser vibrometer for vibration measurements'19995,440,389'Optical sensor for rotational movements having an optical running period element'19955,341,211'Apparatus for making absolute two-demensional position measurements'19945,293,215'Device for interferometric detection of surface structures'19945,141,317'Method of optoelectronically measuring distances and angles'1992Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1992–2017Patents assigned to BOSCH GMBH ROBERT (29)· patent assignee history
1992–1999Based in Ditzingen, DE· patent location history
1999–2017Based in Tiefenbronn, DE· patent location history
2011–2016Patents assigned to DRABAREK PAWEL (4)· patent assignee history
2014Patents assigned to FLEISCHER MATTHIAS (1)· patent assignee history
2016Patents assigned to LESSING ULRICH (1)· patent assignee history
2016Patents assigned to ORTNER GERHARD (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| BOSCH GMBH ROBERT | 29 | 1992–2017 |
| DRABAREK PAWELself | 4 | 2011–2016 |
| FLEISCHER MATTHIAS | 1 | 2014 |
| LESSING ULRICH | 1 | 2016 |
| ORTNER GERHARD | 1 | 2016 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tiefenbronn, DE | 24 | 1999–2017 |
| Ditzingen, DE | 5 | 1992–1999 |