Inventor
DAWEI HU
Inventor
CN
Overview
Patents· 11 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties21%
C10GCracking hydrocarbon oils10%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light10%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1010%
G01BMeasuring length, thickness or similar linear dimensions7%
G01LMeasuring force, stress, torque, work, mechanical power, mechanical efficiency, or fluid pressure7%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices7%
H01LSemiconductor devices7%
B01JChemical or physical processes, e.g. catalysis or colloid chemistry3%
C01BNon-metallic elements3%
PatentTitleYear
12,532,710Measurements of semiconductor structures based on spectral differences at different process steps202612,502,654Hydrogenation catalyst and preparation method therefor and use thereof202512,467,004Process and system for hydrotreating deoiled asphalt202512,331,256Process and system for processing aromatics-rich fraction oil202511,796,390Bandgap measurements of patterned film stacks using spectroscopic metrology202311,573,077Scatterometry based methods and systems for measurement of strain in semiconductor structures202311,486,249Combined rock-breaking TBM tunneling method in complex strata for realizing three-way force detection202211,415,498Rock high-stress high-temperature micro-nano indentation test system202211,378,451Bandgap measurements of patterned film stacks using spectroscopic metrology202211,231,362Multi-environment polarized infrared reflectometer for semiconductor metrology202211,156,548Measurement methodology of advanced nanostructures2021Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2021–2022Patents assigned to KLA TENCOR CORP (2)· patent assignee history
2021–2026Based in CN· patent location history
2022–2026Patents assigned to KLA CORP (5)· patent assignee history
2022Patents assigned to INST ROCK & SOIL MECH CAS (2)· patent assignee history
2022–2023Based in US· patent location history
2025Patents assigned to CHINA PETROLEUM & CHEM CORP (3)· patent assignee history
2025Patents assigned to SINOPEC RES INST PETROLEUM (3)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| KLA CORP | 5 | 2022–2026 |
| CHINA PETROLEUM & CHEM CORP | 3 | 2025 |
| SINOPEC RES INST PETROLEUM | 3 | 2025 |
| INST ROCK & SOIL MECH CAS | 2 | 2022 |
| KLA TENCOR CORP | 2 | 2021–2022 |
Locations
| Location | Patents | Span |
|---|---|---|
| CN | 9 | 2021–2026 |
| US | 2 | 2022–2023 |