Inventor
Dae-Gab Chi
Inventor
Gyeonggi-do, KR
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables56%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1033%
G11CStatic stores11%
PatentTitleYear
8,400,174'Method of correcting a position of a prober'20137,408,339'Test system of semiconductor device having a handler remote control and method of operating the same'20087,230,417'Test system of semiconductor device having a handler remote control and method of operating the same'20076,960,908'Method for electrical testing of semiconductor package that detects socket defects in real time'20056,922,050'Method for testing a remnant batch of semiconductor devices'2005Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2005–2013Patents assigned to SAMSUNG ELECTRONICS CO LTD (5)· patent assignee history
2005–2008Based in Gyeonggi-do, KR· patent location history
2005Based in Kyungki-do, KR· patent location history
2013Patents assigned to CHI DAE-GAB (1)· patent assignee history
2013Patents assigned to KIM BYOUNG JOO (1)· patent assignee history
2013Patents assigned to KIM KI-YOON (1)· patent assignee history
2013Patents assigned to OH SEUNG-YONG (1)· patent assignee history
2013Based in Yongin-si, KR· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| SAMSUNG ELECTRONICS CO LTD | 5 | 2005–2013 |
| CHI DAE-GABself | 1 | 2013 |
| KIM BYOUNG JOO | 1 | 2013 |
| KIM KI-YOON | 1 | 2013 |
| OH SEUNG-YONG | 1 | 2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Gyeonggi-do, KR | 3 | 2005–2008 |
| Yongin-si, KR | 1 | 2013 |
| Kyungki-do, KR | 1 | 2005 |