Inventor
Cheng-Wen Wu
Inventor
Hsinchu, TW
Overview
Patents· 28 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G11Cprimary
G11CStatic stores26%
G01RMeasuring electric variables15%
G06FElectric digital data processing9%
C12QMeasuring or testing processes involving enzymes, nucleic acids or microorganisms6%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h106%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h106%
G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein4%
H01LSemiconductor devices4%
H03MCoding4%
H04BTransmission4%
PatentTitleYear
11,048,119Keyboard device and operation method thereof20219,905,277'Memory controlling method and memory system'20188,977,942'Data error-detection system and data error-detection method thereof'20158,937,486'Method for testing through-silicon-via'20158,742,839'Double through silicon via structure'20148,531,199'Method for testing through-silicon-via and the circuit thereof'20138,443,032'Multiplication circuit and de/encryption circuit utilizing the same'20138,307,261'Non-volatile memory management method'20128,160,413'Fiber optic coupler with variable coupling ratio and manufacturing method thereof'20128,095,832'Method for repairing memory and system thereof'20127,904,768'Probing system for integrated circuit devices'20117,859,900'Built-in self-repair method for NAND flash memory and system thereof'20107,675,309'Probing system for integrated circuit device'20107,644,323'Method and apparatus of build-in self-diagnosis and repair in a memory with syndrome identification'20107,507,534'Rapid efficacy assessment method for lung cancer therapy'20097,354,709'Collapsin response mediator protein-1'20087,319,625'Built-in memory current test circuit'20087,228,468'Method and apparatus of build-in self-diagnosis and repair in a memory with syndrome identification'20077,117,409'Multi-port memory testing method utilizing a sequence folding scheme for testing time reduction'20067,065,689'Diagonal testing method for flash memories'20066,934,900'Test pattern generator for SRAM and DRAM'20056,529,430'Built-in programmable self-diagnostic circuit for SRAM unit'20036,459,638'Built-in programmable self-diagnostic circuit for SRAM unit'20026,415,403'Programmable built in self test for embedded DRAM'20026,218,114'Methods for detecting differentially expressed genes'20016,181,840'Reflectivity-tunable fiber optic reflector'20015,939,428'Alkyl N-›3-(acridin-9-yl)amino-5-hydroxymethyl! phenylcarbamates'19995,570,375'IEEE Std. 1149.1 boundary scan circuit capable of built-in self-testing'1996Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1996–2015Based in Hsinchu, TW· patent location history
1999–2021Based in Taipei, TW· patent location history
2001–2008Patents assigned to ACADEMIA SINICA (2)· patent assignee history
2002–2003Patents assigned to FARADAY TECH CORP (2)· patent assignee history
2007–2018Patents assigned to IND TECH RES INST (4)· patent assignee history
2010–2015Patents assigned to NAT UNIV TSING HUA (9)· patent assignee history
2012–2013Patents assigned to WU CHENG WEN (4)· patent assignee history
2012Based in Taichung, TW· patent location history
2015Based in Hsinchu County, TW· patent location history
2018Based in Tainan, TW· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| NAT UNIV TSING HUA | 9 | 2010–2015 |
| IND TECH RES INST | 4 | 2007–2018 |
| WU CHENG WENself | 4 | 2012–2013 |
| ACADEMIA SINICA | 2 | 2001–2008 |
| FARADAY TECH CORP | 2 | 2002–2003 |
Locations
| Location | Patents | Span |
|---|---|---|
| Hsinchu, TW | 19 | 1996–2015 |
| Taipei, TW | 4 | 1999–2021 |
| Tainan, TW | 1 | 2018 |
| Hsinchu County, TW | 1 | 2015 |
| Taichung, TW | 1 | 2012 |