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Inventor

Christian Bernatek

Inventor
Rodgau, DE

Overview

2→
Patents
2002–2007
Patent span
Physics
Primary field (CPC G)

Patents· 2 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties67%
G06TImage data processing or generation, in general33%
PatentTitleYear
7,308,127'Method for determining and evaluating defects in a sample surface'20076,466,313'Method and apparatus for determining the time curve of the intensity of radiation in a weathering testing device'2002

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2002–2007Patents assigned to ATLAS MAT TESTING TECH GMBH (2)· patent assignee history
2002–2007Based in Rodgau, DE· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
ATLAS MAT TESTING TECH GMBH22002–2007
Locations
LocationPatentsSpan
Rodgau, DE22002–2007