Inventor
Ramakrishna Pattikonda
Inventor
Dallas, TX, US
Overview
Patents· 6 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties29%
G06TImage data processing or generation, in general29%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1018%
G01BMeasuring length, thickness or similar linear dimensions6%
G06FElectric digital data processing6%
G06VImage or video recognition or understanding6%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h106%
PatentTitleYear
7,039,228'System and method for three-dimensional surface inspection'20066,292,582'Method and system for identifying defects in a semiconductor'20016,246,788'System and method of optically inspecting manufactured devices'20016,205,239'System and method for circuit repair'20016,091,846'Method and system for anomaly detection'20006,014,461'Apparatus and method for automatic knowlege-based object identification'2000Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2000–2001Patents assigned to TEXAS INSTRUMENTS INC (3)· patent assignee history
2000–2006Based in Dallas, TX, US· patent location history
2000Based in Lubbock, TX, US· patent location history
2001Patents assigned to ISOA INC (1)· patent assignee history
2006Patents assigned to RUDOLPH TECHNOLOGIES INC (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TEXAS INSTRUMENTS INC | 3 | 2000–2001 |
| ISOA INC | 1 | 2001 |
| RUDOLPH TECHNOLOGIES INC | 1 | 2006 |
Locations
| Location | Patents | Span |
|---|---|---|
| Dallas, Texas, US | 5 | 2000–2006 |
| Lubbock, Texas, US | 1 | 2000 |