Inventor
Joseph Benjamin Ross
Inventor
Cincinnati, OH, US
Overview
Patents· 16 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions48%
G01NInvestigating or analysing materials by determining their chemical or physical properties17%
F01DNon-positive displacement machines or engines, e.g. steam turbines10%
G06TImage data processing or generation, in general10%
G02BOptical elements, systems or apparatus3%
G06FElectric digital data processing3%
Y02TClimate change mitigation technologies related to transportation3%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests3%
PatentTitleYear
9,587,933'System and method for inspecting an object'20178,045,181'Inspection system and method with multi-image phase shift analysis'20117,925,075'Inspection system and methods with autocompensation for edge break gauging orientation'20117,898,651'Methods and apparatus for inspecting an object'20117,499,830'Computer-implemented techniques and system for characterizing geometric parameters of an edge break in a machined part'20097,365,862'Methods and apparatus for inspecting an object'20087,327,857'Non-contact measurement method and apparatus'20087,302,109'Method and system for image processing for structured light profiling of a part'20077,301,165'Methods and apparatus for inspecting an object'20077,194,474'Method of processing test information'20077,187,436'Multi-resolution inspection system and method of operating same'20077,099,017'Methods and apparatus for measuring flow opening areas'20066,985,238'Non-contact measurement system for large airfoils'20066,906,808'Methods and apparatus for measuring a surface contour of an object'20056,700,668'Method of measuring a part with a wide range of surface reflectivities'20046,678,057'Method and device for reduction in noise in images from shiny parts'2004Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2004–2017Patents assigned to GEN ELECTRIC (16)· patent assignee history
2004–2017Based in Cincinnati, OH, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| GEN ELECTRIC | 16 | 2004–2017 |
Locations
| Location | Patents | Span |
|---|---|---|
| Cincinnati, OH, US | 16 | 2004–2017 |