Inventor
Hiroshi Makino
Inventor
Kokubunji, JP
Overview
Patents· 122 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Jprimary
H01JElectric discharge tubes or discharge lamps13%
G01NInvestigating or analysing materials by determining their chemical or physical properties6%
G11CStatic stores5%
B01DSeparation5%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests5%
G06FElectric digital data processing4%
Y10TTechnical subjects covered by former us classification4%
H03KPulse technique3%
G01RMeasuring electric variables3%
B60JWindows, windscreens, non-fixed roofs, doors, or similar devices for vehicles2%
PatentTitleYear
11,116,805Preventive and therapeutic agent for celiac disease202111,043,874Motor and robot202110,842,928Adapter for blood dispensing202010,456,829Method for modifying refractory molding particles and refractory molding particles obtained thereby and process for producing mold201910,242,733Semiconductor memory device that can stably perform writing and reading without increasing current consumption even with a low power supply voltage20199,984,744Semiconductor memory device that can stably perform writing and reading without increasing current consumption even with a low power supply voltage20189,922,543'Battery-powered security sensor system'20189,870,699'Battery-powered security sensor system'20189,863,312'Internal combustion engine and manufacturing method therefor'20189,767,893'Semiconductor memory device that can stably perform writing and reading without increasing current consumption even with a low power supply voltage'20179,627,171'Charged particle beam device'20179,576,456'Solar battery-driven object detection system'20179,496,028'Semiconductor memory device that can stably perform writing and reading without increasing current consumption even with a low power supply voltage'20169,472,376'Scanning electron microscope'20169,388,474'Method for detecting toxin-producing Clostridium difficile'20169,386,678'Plasma generator and plasma generating device'20169,218,873'Semiconductor memory device that can stably perform writing and reading without increasing current consumption even with a low power supply voltage'20159,046,624'Infrared security sensor'20159,036,325'Ion wind generator and ion wind generating device'20158,929,049'Ion wind generator and ion wind generating device'20158,890,068'Charged particle ray apparatus and pattern measurement method'20148,841,612'Charged particle beam microscope'20148,729,805'Plasma generator and discharge device and reactor using plasma generator'20148,648,300'Charged particle beam apparatus'20148,630,142'Semiconductor memory device that can stably perform writing and reading without increasing current consumption even with a low power supply voltage'20148,586,920'Charged particle beam apparatus'20138,502,141'Graphical user interface for use with electron beam wafer inspection'20138,474,574'Sound absorbing structure'20138,420,539'Additive for polishing composition'20138,405,025'Scanning electron microscope and method for detecting an image using the same'20138,308,972'Additive for polishing composition'20128,218,390'Semiconductor memory device that can stably perform writing and reading without increasing current consumption even with a low power supply voltage'20128,193,350'Fluorescent compound and labeling agent comprising the same'20128,193,493'Charged particle beam apparatus'20128,009,500'Semiconductor memory device that can stably perform writing and reading without increasing current consumption even with a low power supply voltage'20117,982,188'Apparatus and method for wafer pattern inspection'20117,906,761'Charged particle beam apparatus'20117,880,143'Electron beam apparatus'20117,860,592'Design method for industrial product using clothoid curve, industrial products designed by the design method, and method and device for numerical control using the clothoid curve'20107,755,776'Inspection system and inspection method'20107,728,294'Semiconductor wafer inspection tool and semiconductor wafer inspection method'20107,683,319'Charge control apparatus and measurement apparatus equipped with the charge control apparatus'20107,655,906'Method and apparatus for scanning and measurement by electron beam'20107,652,248'Inspection apparatus and inspection method'20107,589,566'Semiconductor device provided with antenna ratio countermeasure circuit'20097,566,871'Method and apparatus for pattern inspection'20097,547,884'Pattern defect inspection method and apparatus thereof'20097,502,275'Semiconductor memory device'20097,501,625'Electron microscope application apparatus and sample inspection method'20097,432,503'Scanning electron microscope and method for detecting an image using the same'20087,420,167'Apparatus and method for electron beam inspection with projection electron microscopy'20087,411,190'Inspection system, inspection method, and process management method'20087,397,031'Method of inspecting a circuit pattern and inspecting instrument'20087,357,449'Sunroof device'20087,098,455'Method of inspecting a circuit pattern and inspecting instrument'20067,075,076'Inspection system, inspection method, and process management method'20067,022,986'Apparatus and method for wafer pattern inspection'20066,897,172'Dielectric ceramic composition and dielectric ceramics'20056,888,138'Absorption current image apparatus in electron microscope'20056,857,039'Bi-directional bus circuitry executing bi-directional data transmission while avoiding floating state'20056,653,693'Semiconductor integrated circuit device'20036,644,728'Sunroof device'20036,635,935'Semiconductor device cell having regularly sized and arranged features'20036,583,413'Method of inspecting a circuit pattern and inspecting instrument'20036,556,071'Semiconductor integrated circuit'20036,525,587'Semiconductor integrated circuit device including a clock synchronous type logical processing circuit'20036,431,644'Sliding roof device'20026,390,545'Sun roof device'20026,386,626'Sunshade for vehicle sunroof'20026,375,589'Roller chain sprocket'20026,285,213'Semiconductor integrated circuit device'20016,278,303'Semiconductor device that can have standby current reduced by ceasing supply of clock signal, and that can maintain status of internal circuit'20016,242,948'Semiconductor integrated circuit device'20016,031,778'Semiconductor integrated circuit'20006,028,398'Cold cathode fluorescent lamp driving apparatus using a piezoelectric transformer'20006,023,989'Transmission device for converting a torque between rotary movement and linear movement'20006,005,422'Semiconductor integrated circuit and consumed power reducing method'19995,999,962'Divider which iteratively multiplies divisor and dividend by multipliers generated from the divisors to compute the intermediate divisors and quotients'19995,877,928'Electronic circuit device'19995,867,415'Multiplication element including a wallace tree circuit having adders divided into high and low order adders'19995,849,194'Apparatus and method for treating waste water both chemically and biologically utilizing reaction fillers'19985,726,926'Shifter for shifting floating point number utilizing arithmetic operation of redundant binary number, and adder containing the same'19985,666,301'Multiplier carrying out numeric calculation at high speed'19975,657,260'Priority detecting counter device'19975,580,458'Method for waste water treatment using calcium carbonate mineral and microorganisms in combination'19965,533,813'Dynamic air pressure bearing'19965,523,035'Process for producing carbonaceous material'19965,480,537'Apparatus for waste water treatment using calcium carbonate mineral and microorganisms in combination'19965,473,559'Hardware implemented multiplier'19955,365,123'Semiconductor logic circuits with diodes and amplitude limiter'19945,311,078'Logic circuit and semiconductor device'19945,175,462'Toroidal coil motor'19925,172,021'Deflector motor with gas bearing and magnet thrust bearing'19925,148,069'Recessed rotation detectors for brushless motors'19924,863,510'Reduction process for preparing copper, silver, and admixed silver-palladium metal particles'19894,735,494'Zoom lens control system and method for zooming control'19884,718,921'Method for removing water vapor from water vapor-containing gas'19884,705,656'Method for producing spherical metal particles'19874,695,893'Automatic focusing apparatus'19874,690,119'EGR valve device of internal combustion engines of automobiles'19874,690,873'Gas separating material'19874,647,511'Flake like metal chips, a method of and an apparatus for making the same'19874,581,726'Ultrasonic distance measuring apparatus'19864,578,783'Ultrasonic distance measuring apparatus'19864,576,099'Pallet transport apparatus'19864,528,004'Aromatic polyimide composite separating membrane'19854,514,084'Distance measuring apparatus'19854,512,893'Porous aromatic imide polymer membrane and a process for its manufacture'19854,486,376'Process for modifying porous polymeric membrane'19844,485,056'Production of aromatic polyimide separating membranes'19844,474,662'Process for producing porous aromatic polyimide membranes'19844,474,858'Aromatic polyimide gas-separating membrane'19844,472,742'Video and sound recording device with automatic focusing system'19844,460,526'Process for producing aromatic polyimide hollow filaments'19844,443,054'Earth terminal for electrical equipment'19844,440,643'Process for producing aromatic polyimide composite separating membrane'19844,378,324'Process for preparing aromatic polyimide semipermeable membranes'19834,378,400'Gas separating material'19834,370,290'Process for producing aromatic polyimide filaments'19834,341,502'Assembly robot'19824,109,548'Parallel indexing cam structure'19784,016,475'DC to DC converter'1977Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1977–2000Patents assigned to WEST ELECTRIC CO (8)· patent assignee history
1977–2000Based in Hirakata, JP· patent location history
1978–2016Patents assigned to MAKINO HIROSHI (20)· patent assignee history
1983–1988Patents assigned to UBE INDUSTRIES (13)· patent assignee history
1983–1987Based in Ichihara, JP· patent location history
1994–2003Patents assigned to MITSUBISHI ELECTRIC CORP (18)· patent assignee history
1994–2005Based in Hyogo, JP· patent location history
1999–2019Based in Tokyo, JP· patent location history
2003–2013Based in Kokubunji, JP· patent location history
2005–2017Patents assigned to HITACHI HIGH TECH CORP (26)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HITACHI HIGH TECH CORP | 26 | 2005–2017 |
| MAKINO HIROSHIself | 20 | 1978–2016 |
| MITSUBISHI ELECTRIC CORP | 18 | 1994–2003 |
| UBE INDUSTRIES | 13 | 1983–1988 |
| WEST ELECTRIC CO | 8 | 1977–2000 |
Locations
| Location | Patents | Span |
|---|---|---|
| Kokubunji, JP | 23 | 2003–2013 |
| Tokyo, JP | 22 | 1999–2019 |
| Ichihara, JP | 12 | 1983–1987 |
| Hyogo, JP | 8 | 1994–2005 |
| Hirakata, JP | 8 | 1977–2000 |