Inventor
Patrick D. Kinney
Inventor
Hayward, CA, US
Overview
Patents· 17 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties22%
B01LChemical or physical laboratory apparatus for general use11%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1011%
C12QMeasuring or testing processes involving enzymes, nucleic acids or microorganisms8%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light8%
H04NPictorial communication, e.g. television8%
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation8%
B01FMixing, e.g. dissolving, emulsifying or dispersing5%
G01RMeasuring electric variables5%
G02BOptical elements, systems or apparatus5%
PatentTitleYear
8,934,098'Fast-indexing filter wheel and method of use'20158,602,958'Methods and assemblies for collecting liquid by centrifugation'20138,530,158'System and method for processing a biological sample'20137,928,354'Methods and systems for in situ calibration of imaging in biological analysis'20117,875,425'Methods for monitoring polymerase chain reactions'20117,541,567'Methods and systems for in situ validation of imaging in biological analysis'20097,394,943'Methods, software, and apparatus for focusing an optical system using computer image analysis'20087,045,756'Methods and systems for in situ calibration of imaging in biological analysis'20066,809,809'Optical method and apparatus for inspecting large area planar objects'20046,630,996'Optical method and apparatus for inspecting large area planar objects'20036,122,562'Method and apparatus for selectively marking a semiconductor wafer'20005,985,680'Method and apparatus for transforming a substrate coordinate system into a wafer analysis tool coordinate system'19995,909,276'Optical inspection module and method for detecting particles and defects on substrates in integrated process tools'19995,870,187'Method for aligning semiconductor wafer surface scans and identifying added and removed particles resulting from wafer handling or processing'19995,422,724'Multiple-scan method for wafer particle analysis'19955,267,017'Method of particle analysis on a mirror wafer'19935,083,865'Particle monitor system and method'1992Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1992–2000Patents assigned to APPLIED MATERIALS INC (6)· patent assignee history
1992Based in Sunnyvale, CA, US· patent location history
1993–2000Based in Coon Rapids, MN, US· patent location history
1999Based in Santa Clara, CA, US· patent location history
2003Based in San Leandro, CA, US· patent location history
2004–2015Based in Hayward, CA, US· patent location history
2006–2008Patents assigned to APPLERA CORP (2)· patent assignee history
2009–2011Patents assigned to APPLIED BIOSYSTEMS LLC (2)· patent assignee history
2011–2015Patents assigned to LIFE TECHNOLOGIES CORP (4)· patent assignee history
2013–2015Patents assigned to KINNEY PATRICK (2)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| APPLIED MATERIALS INC | 6 | 1992–2000 |
| LIFE TECHNOLOGIES CORP | 4 | 2011–2015 |
| APPLERA CORP | 2 | 2006–2008 |
| APPLIED BIOSYSTEMS LLC | 2 | 2009–2011 |
| KINNEY PATRICKself | 2 | 2013–2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| Hayward, California, US | 9 | 2004–2015 |
| Coon Rapids, Minnesota, US | 5 | 1993–2000 |
| San Leandro, California, US | 1 | 2003 |
| Santa Clara, California, US | 1 | 1999 |
| Sunnyvale, California, US | 1 | 1992 |