Inventor

Guenther Kostka

Inventor
Erlangen, DE

Overview

25→
Patents
2003–2021
Patent span
Physics
Primary field (CPC G)

Patents· 25 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions16%
G06TImage data processing or generation, in general15%
G01NInvestigating or analysing materials by determining their chemical or physical properties9%
H04NPictorial communication, e.g. television9%
G01TMeasurement of nuclear or x-radiation7%
G06VImage or video recognition or understanding6%
A61BDiagnosis4%
B29DProducing particular articles from plastics or from substances in a plastic state4%
B65HHandling thin or filamentary material, e.g. sheets, webs, cables4%
G01MTesting static or dynamic balance of machines or structures4%
PatentTitleYear
11,086,029Apparatus for optically capturing a screen202110,308,464Apparatus and method for determining a distance measure on wound-up materials201910,204,405Apparatus and method for parameterizing a plant20199,891,168'Device and method for sensing at least one partially specular surface with column-by-column analysis of the global or local intensity maximum'20189,886,749'Apparatus and method for parameterizing a plant'20189,733,126'Device and method for measuring a complexly formed object'20179,429,665'Radiation penetration system and calibration of the same'20169,342,895'Device and method for detecting a plant against a background using photographs with different levels of brightness'20169,322,642'Apparatus and method for determining a distance measure on wound-up materials'20169,300,936'Camera arrangement for image detection, x-ray system and method for balancing and operating'20168,892,396'Apparatus and method for determining a distance measure on wound-up materials'20148,340,402'Device and method for detecting a plant'20128,228,488'Method and apparatus for thickness measurement'20128,218,153'Apparatus and method for improving the measurement accuracy of digital 3D geometrical measurement systems'20128,155,429'Apparatus and method for generating a two-dimensional representation of an object portion arbitrarily arranged within an object'20128,064,072'Method and apparatus for thickness measurement'20117,920,938'Concept for monitoring the manufacture of objects consisting of multiple material layers'20117,875,855'Apparatus and method for detecting an image'20117,807,975'Apparatus and method for detecting an image'20107,772,561'Apparatus and method for detecting an image'20107,706,634'Method and camera (apparatus) for optically capturing a screen'20107,696,480'Method and apparatus for determining an object material'20107,257,996'Device and method for a quality test of a body'20077,088,442'Device and method for a quality test of a body'20066,539,789'Detection of irregularities in a convex surface, such as a tire sidewall, using band-pass filtering'2003

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2003–2021Patents assigned to FRAUNHOFER GES FORSCHUNG (22)· patent assignee history
2003–2021Based in Erlangen, DE· patent location history
2011–2014Patents assigned to KOSTKA GUENTHER (6)· patent assignee history
2011–2014Patents assigned to SCHMITT PETER (5)· patent assignee history
2012–2014Patents assigned to SCHOLZ OLIVER (3)· patent assignee history
2016–2017Patents assigned to FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG E V (2)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
FRAUNHOFER GES FORSCHUNG222003–2021
KOSTKA GUENTHERself62011–2014
SCHMITT PETER52011–2014
SCHOLZ OLIVER32012–2014
FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG E V22016–2017
Locations
LocationPatentsSpan
Erlangen, DE252003–2021