Inventor

Danny R. Cline

Inventor

Plano, TX, US

Overview

1993–2008

Patent span

Physics

Primary field (CPC G)

Patents· 17 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G11Cprimary

G11CStatic stores39%

G06FElectric digital data processing27%

G01RMeasuring electric variables25%

H03KPulse technique5%

G05FSystems for regulating electric or magnetic variables2%

H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h102%

PatentTitleYear

7,328,388'Built-in self-test arrangement for integrated circuit memory devices'2008 7,278,078'Built-in self-test arrangement for integrated circuit memory devices'2007 6,801,461'Built-in self-test arrangement for integrated circuit memory devices'2004 6,438,718'Wordline stress mode arrangement a storage cell initialization scheme test time reduction burn-in elimination'2002 6,353,563'Built-in self-test arrangement for integrated circuit memory devices'2002 6,014,336'Test enable control for built-in self-test'2000 6,002,286'Apparatus and method for a programmable interval timing generator in a semiconductor memory'1999 5,991,213'Short disturb test algorithm for built-in self-test'1999 5,959,912'ROM embedded mask release number for built-in self-test'1999 5,953,272'Data invert jump instruction test for built-in self-test'1999 5,923,599'Apparatus and method for subarray testing in dynamic random access memories using a built-in-self-test unit'1999 5,883,843'Built-in self-test arrangement for integrated circuit memory devices'1999 5,875,153'Internal/external clock option for built-in self test'1999 5,841,707'Apparatus and method for a programmable interval timing generator in a semiconductor memory'1998 5,742,614'Apparatus and method for a variable step address generator'1998 5,309,446'Test validation method for a semiconductor memory device'1994 5,220,534'Substrate bias generator system'1993

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1993–2008Patents assigned to TEXAS INSTRUMENTS INC (17)· patent assignee history

1993–2002Based in Plano, TX, US· patent location history

1999–2008Based in Dallas, TX, US· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
TEXAS INSTRUMENTS INC	17	1993–2008

Locations

Location	Patents	Span
Plano, Texas, US	11	1993–2002
Dallas, Texas, US	6	1999–2008