Inventor
Marshall H. Scott
Inventor
Woodinville, WA, US
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G06Fprimary
G06FElectric digital data processing50%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light13%
G01NInvestigating or analysing materials by determining their chemical or physical properties13%
G01RMeasuring electric variables13%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests13%
PatentTitleYear
10,168,212Optical spectroscopic measurement system20195,136,590'Kernel testing interface and method for automating diagnostics of microprocessor-based systems'19924,868,822'Memory emulation method and system for testing and troubleshooting microprocessor-based electronic systems'19894,709,366'Computer assisted fault isolation in circuit board testing'19874,455,654'Test apparatus for electronic assemblies employing a microprocessor'1984Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1984–1992Patents assigned to FLUKE MFG CO JOHN (4)· patent assignee history
1984–1992Based in Woodinville, WA, US· patent location history
2019Patents assigned to THORLABS INC (1)· patent assignee history
2019Based in Newton, NJ, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| FLUKE MFG CO JOHN | 4 | 1984–1992 |
| THORLABS INC | 1 | 2019 |
Locations
| Location | Patents | Span |
|---|---|---|
| Woodinville, Washington, US | 4 | 1984–1992 |
| Newton, New Jersey, US | 1 | 2019 |