Inventor
Hideaki Endo
Inventor
Tokyo, JP
Overview
Patents· 19 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G02Bprimary
G02BOptical elements, systems or apparatus50%
C12MApparatus for enzymology or microbiology18%
B60KArrangement or mounting of propulsion units or of transmissions in vehicles7%
B60WConjoint control of vehicle sub-units of different type or different function7%
G01NInvestigating or analysing materials by determining their chemical or physical properties4%
G08GTraffic control systems4%
H03KPulse technique4%
H05BElectric heating4%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests4%
PatentTitleYear
10,191,267Microscope system20199,758,176'Vehicle control apparatus'20179,290,177'Vehicle control apparatus'20168,451,534'Microscope system and method for controlling it'20138,369,010'Microscope with motion sensor for control of power supply and light source'20138,192,982'Tissue culture microscope apparatus'20127,973,432'Microscope system and control method for same'20117,910,355'Culture observation apparatus'20117,822,257'Observation apparatus and observation method'20107,816,126'Culture observation apparatus, sample tray heat-insulating device and lid'20107,595,188'Observation apparatus'20097,486,329'Focusing state signal output apparatus for a microscope representing a relative distance between a subject and an image sensing apparatus'20097,486,886'Photo-micrographing device and its control method'20097,397,602'Fluorescent microscope'20087,382,531'Microscope and method of preventing dew condensation on objective lens'20086,649,893'Focus detecting device for an optical apparatus'20036,219,181'Monitor-aided microscope'20016,043,475'Focal point adjustment apparatus and method applied to microscopes'20004,890,022'Delay circuit device utilizing the Miller effect'1989Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1989–2017Based in Tokyo, JP· patent location history
2000–2009Patents assigned to OLYMPUS OPTICAL CO (4)· patent assignee history
2000–2010Based in Hachioji, JP· patent location history
2008–2019Patents assigned to OLYMPUS CORP (11)· patent assignee history
2008–2019Based in Hino, JP· patent location history
2012–2013Patents assigned to ENDO HIDEAKI (3)· patent assignee history
2012Patents assigned to HASEGAWA KAZUHIRO (1)· patent assignee history
2016–2017Patents assigned to FUJI HEAVY IND LTD (2)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| OLYMPUS CORP | 11 | 2008–2019 |
| OLYMPUS OPTICAL CO | 4 | 2000–2009 |
| ENDO HIDEAKIself | 3 | 2012–2013 |
| FUJI HEAVY IND LTD | 2 | 2016–2017 |
| HASEGAWA KAZUHIRO | 1 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 11 | 1989–2017 |
| Hachioji, JP | 5 | 2000–2010 |
| Hino, JP | 3 | 2008–2019 |