Inventor
Michael E. Fossey
Inventor
Charlotte, NC, US
Overview
Patents· 13 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties21%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1017%
G06TImage data processing or generation, in general13%
G08GTraffic control systems13%
H04NPictorial communication, e.g. television13%
G01SRadio direction-finding4%
G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein4%
G06FElectric digital data processing4%
G08BSignalling systems, e.g. personal calling systems4%
H01SDevices using the process of light amplification by stimulated emission of radiation [laser] to amplify or generate light4%
PatentTitleYear
RE045452'System for and method of synchronous acquisition of pulsed source light in performance of monitoring aircraft flight operation'2015RE044604'System for and method of synchronous acquisition of pulsed source light in performance of monitoring aircraft flight operation'20137,705,879'System for and method of synchronous acquisition of pulsed source light in performance of monitoring aircraft flight operation'20106,509,965'Wafer inspection system for distinguishing pits and particles'20036,292,259'Wafer inspection system for distinguishing pits and particles'20016,122,047'Methods and apparatus for identifying the material of a particle occurring on the surface of a substrate'20006,118,525'Wafer inspection system for distinguishing pits and particles'20005,988,971'Wafer transfer robot'19995,712,701'Surface inspection system and method of inspecting surface of workpiece'19985,565,852'Smoke detector with digital display'19965,361,268'Switchable two-wavelength frequency-converting laser system and power control therefor'19944,916,536'Imaging range finder and method'19904,698,785'Method and apparatus for detecting control system data processing errors'1987Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1987–2013Patents assigned to FOSSEY MICHAEL E (2)· patent assignee history
1987Patents assigned to DESMOND JOHN P (1)· patent assignee history
1990–1994Based in Beaverton, OR, US· patent location history
1994Patents assigned to ELECTRO SCIENT IND INC (1)· patent assignee history
1996–2001Based in Charlotte, NC, US· patent location history
1998–2003Patents assigned to ADE OPTICAL SYST CORP (6)· patent assignee history
2000–2003Based in Newbury Park, CA, US· patent location history
2000Based in Woodland Hills, CA, US· patent location history
2010–2015Patents assigned to MAX VIZ INC (3)· patent assignee history
2010–2015Based in Portland, OR, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ADE OPTICAL SYST CORP | 6 | 1998–2003 |
| MAX VIZ INC | 3 | 2010–2015 |
| FOSSEY MICHAEL Eself | 2 | 1987–2013 |
| DESMOND JOHN P | 1 | 1987 |
| ELECTRO SCIENT IND INC | 1 | 1994 |
Locations
| Location | Patents | Span |
|---|---|---|
| Charlotte, NC, US | 4 | 1996–2001 |
| Portland, OR, US | 3 | 2010–2015 |
| Newbury Park, California, US | 2 | 2000–2003 |
| Beaverton, OR, US | 2 | 1990–1994 |
| Woodland Hills, California, US | 1 | 2000 |