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Inventor

Yoshifumi Taniguchi

Inventor
Hitachinaka, JP

Overview

27→
Patents
1981–2021
Patent span
Electricity
Primary field (CPC H)

Patents· 27 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H01Jprimary
H01JElectric discharge tubes or discharge lamps51%
G01NInvestigating or analysing materials by determining their chemical or physical properties17%
B82YSpecific uses or applications of nanostructures7%
F01NGas-flow silencers or exhaust apparatus for machines or engines in general5%
F02BInternal-combustion piston engines5%
G01LMeasuring force, stress, torque, work, mechanical power, mechanical efficiency, or fluid pressure5%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h105%
A63FCard, board, or roulette games2%
LOC162%
PatentTitleYear
11,033,812Input apparatus, method, and game processing method202110,636,621Charged particle beam device for moving an aperture having plurality of openings and sample observation method202010,535,497Electron microscope and imaging method20209,679,738'Electron microscope'20179,558,910'Sample holder for electron microscope'20178,530,858'Transmission electron microscope apparatus comprising electron spectroscope, sample holder, sample stage, and method for acquiring spectral image'20138,436,301'Transmission electron microscope having electron spectrometer'20138,263,936'Transmission electron microscope having electron spectroscope'2012D0636005'Electron microscope'20117,812,310'Charged particle beam apparatus and specimen holder'20107,723,682'Transmission electron microscope provided with electronic spectroscope'20107,622,714'Standard specimen for a charged particle beam apparatus, specimen preparation method thereof, and charged particle beam apparatus'20097,385,198'Method and apparatus for measuring the physical properties of micro region'20087,381,968'Charged particle beam apparatus and specimen holder'20087,235,784'Transmission electron microscope and image observation method using it'20077,022,988'Method and apparatus for measuring physical properties of micro region'20066,992,286'Material characterization system'20066,930,306'Electron microscope'20056,855,927'Method and apparatus for observing element distribution'20056,750,451'Observation apparatus and observation method using an electron beam'20046,150,657'Energy filter and electron microscope equipped with the energy filter'20006,066,852'Electron energy filter'20005,981,948'Transmission electron microscope and method of observing element distribution'19995,585,630'Electron energy filter and transmission electron microscope provided with the same'19965,578,823'Transmission electron microscope and method of observing element distribution by using the same'19964,331,213'Automobile exhaust control system'19824,303,143'Exhaust gas control system'1981

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1981–1982Patents assigned to LEITH MITSUKO (2)· patent assignee history
1981–1982Based in Toyonaka, JP· patent location history
1996–2008Patents assigned to HITACHI LTD (8)· patent assignee history
1996–2013Based in Hitachinaka, JP· patent location history
1996Based in Ibaraki, JP· patent location history
2005–2020Patents assigned to HITACHI HIGH TECH CORP (15)· patent assignee history
2012–2013Patents assigned to TANIGUCHI YOSHIFUMI (3)· patent assignee history
2012–2013Patents assigned to TERADA SHOHEI (3)· patent assignee history
2017–2020Based in Tokyo, JP· patent location history
2021Based in Kyoto, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
HITACHI HIGH TECH CORP152005–2020
HITACHI LTD81996–2008
TANIGUCHI YOSHIFUMIself32012–2013
TERADA SHOHEI32012–2013
LEITH MITSUKO21981–1982
Locations
LocationPatentsSpan
Hitachinaka, JP191996–2013
Tokyo, JP42017–2020
Toyonaka, JP21981–1982
Kyoto, JP12021
Ibaraki, JP11996