Inventor
Nan-Hsin Tseng
Inventor
Tainan, TW
Overview
Patents· 19 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables30%
H03KPulse technique16%
G06FElectric digital data processing8%
G11CStatic stores8%
H01LSemiconductor devices8%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h108%
G04FTime-interval measuring5%
H03BGeneration of oscillations, directly or by frequency-changing, by circuits employing active elements which operate in a non-switching manner5%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h105%
H01JElectric discharge tubes or discharge lamps3%
PatentTitleYear
10,868,494Device and method of operating the same202010,277,206Integrated circuit with an oscillating signal-generating assembly20199,714,979'Contactless signal testing'20179,478,469'Integrated circuit comprising buffer chain'20169,423,452'Contactless signal testing'20169,310,431'Diagnosis framework to shorten yield learning cycles of advanced processes'20169,269,537'E-beam lithography with alignment gating'20169,117,796'Semiconductor arrangement and formation thereof'20159,059,685'Circuit and method for pulse width measurement'20158,981,842'Integrated circuit comprising buffer chain'20158,937,512'Voltage-controlled oscillator'20158,832,511'Built-in self-test for interposer'20148,680,882'3D-IC interposer testing structure and method of testing the structure'20148,614,571'Apparatus and method for on-chip sampling of dynamic IR voltage drop'20138,384,430'RC delay detectors with high sensitivity for through substrate vias'20138,339,155'System and method for detecting soft-fails'20128,305,847'Ultra high resolution timing measurement'20128,113,412'Methods for detecting defect connections between metal bumps'20127,986,591'Ultra high resolution timing measurement'2011Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2011–2016Patents assigned to TAIWAN SEMICONDUCTOR MFG (13)· patent assignee history
2011–2013Based in Shanhua Township, TW· patent location history
2012–2016Patents assigned to TSENG NAN-HSIN (8)· patent assignee history
2012–2014Patents assigned to LIU CHIN-CHOU (6)· patent assignee history
2012–2016Patents assigned to CHANGCHIEN WEI-PIN (4)· patent assignee history
2012–2020Based in Tainan, TW· patent location history
2015Based in Hsinchu County, TW· patent location history
2016–2020Patents assigned to TAIWAN SEMICONDUCTOR MFG CO LTD (6)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TAIWAN SEMICONDUCTOR MFG | 13 | 2011–2016 |
| TSENG NAN-HSINself | 8 | 2012–2016 |
| LIU CHIN-CHOU | 6 | 2012–2014 |
| TAIWAN SEMICONDUCTOR MFG CO LTD | 6 | 2016–2020 |
| CHANGCHIEN WEI-PIN | 4 | 2012–2016 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tainan, TW | 14 | 2012–2020 |
| Shanhua Township, TW | 4 | 2011–2013 |
| Hsinchu County, TW | 1 | 2015 |