Inventor

Yasushi Kaneda

Inventor
Tokyo, JP

Overview

30→
Patents
1994–2012
Patent span
Physics
Primary field (CPC G)

Patents· 30 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Dprimary
G01DMeasuring not specially adapted for a specific variable48%
G01BMeasuring length, thickness or similar linear dimensions11%
G01PMeasuring linear or angular speed, acceleration, deceleration, or shock11%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light7%
G01KMeasuring temperature7%
G02BOptical elements, systems or apparatus7%
B05DProcesses for applying fluent materials to surfaces, in general2%
B81CProcesses or apparatus specially adapted for the manufacture or treatment of microstructural devices or systems2%
G01SRadio direction-finding2%
G11BInformation storage based on relative movement between record carrier and transducer2%
PatentTitleYear
8,309,176'Manufacturing method of three-dimensional structure'20128,305,683'Polarizer'20127,375,820'Interference measuring apparatus for detecting a plurality of stable phase difference signals'20087,034,947'Compact interference measuring apparatus for detecting the magnitude and direction of positional deviation'20066,900,939'Polarization insensitive beam splitting grating and apparatus using it'20056,674,066'Encoder'20046,657,181'Optical element used in compact interference measuring apparatus detecting plurality of phase difference signals'20036,618,218'Displacement detecting apparatus and information recording apparatus'20036,473,184'Interferometer which divides light beams into a plurality of beams with different optical paths'20026,259,531'Displacement information measuring apparatus with hyperbolic diffraction grating'20016,227,702'Method and apparatus for measuring a temperature of a molten metal'20016,004,031'Temperature measuring device'19995,880,839'Optical displacement measuring apparatus including a light-emitting element and an adjacent ball lens'19995,760,392'Scale for use with a displacement sensor'19985,742,391'Optical type sensor for use as an optical measuring head or optical pickup'19985,733,043'Temperature measuring device'19985,680,211'Apparatus for optically detecting displacement of an object using a synthesizing means utilizing a substrate with two diffraction gratings thereon'19975,666,196'Optical detection apparatus for detecting information relating to relative displacement of an object on whch a diffraction grating is formed'19975,661,296'Rotary encoder measuring substantially coinciding phases of interference light components'19975,657,125'Apparatus including a light-detecting element having a photo-electric conversion surface and an integral light blocking member'19975,621,527'Apparatus for measuring relative displacement between the apparatus and a scale which a grating is formed'19975,574,559'Displacement detection apparatus using multiple displacement detection signals formed by a multiple phase combination grating'19965,569,913'Optical displacement sensor'19965,557,396'Velocity information detecting apparatus'19965,537,210'Rotation detecting apparatus and scale having a multi helix diffraction grating for the same'19965,534,693'Optical displacement detection apparatus employing diffraction gratings and a reference position sensor located on the scale'19965,483,377'Displacement detection apparatus'19965,448,358'Optical apparatus and displacement-information measuring apparatus using the same'19955,390,022'Displacement information detection apparatus for receiving a divergent light beam'19955,283,434'Displacement detecting device with integral optics'1994

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1994–2012Patents assigned to CANON KK (27)· patent assignee history
1994–1997Based in Tokyo, JP· patent location history
1996–2001Based in Utsunomiya, JP· patent location history
1998–2001Patents assigned to NIPPON KOKAN KK (3)· patent assignee history
1998–2001Based in Kawasaki, JP· patent location history
2002–2008Based in Urawa, JP· patent location history
2005–2012Based in Saitama, JP· patent location history
2012Patents assigned to ASANO KOSUKE (2)· patent assignee history
2012Patents assigned to ISANO TAISUKE (2)· patent assignee history
2012Patents assigned to KANEDA YASUSHI (2)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
CANON KK271994–2012
NIPPON KOKAN KK31998–2001
ASANO KOSUKE22012
ISANO TAISUKE22012
KANEDA YASUSHIself22012
Locations
LocationPatentsSpan
Tokyo, JP131994–1997
Urawa, JP62002–2008
Utsunomiya, JP51996–2001
Saitama, JP32005–2012
Kawasaki, JP31998–2001