Inventor
Shengli Xie
Inventor
Guangzhou, CN
Overview
Patents· 3 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions50%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light17%
G01MTesting static or dynamic balance of machines or structures17%
H01SDevices using the process of light amplification by stimulated emission of radiation [laser] to amplify or generate light17%
PatentTitleYear
11,108,212Optical interference light source device of current-temperature controlled semiconductor laser and measurement system including the same202111,092,511Device and method for measuring lens contour based on laser wave number scanning202111,060,849Dual-channel optical three-dimensional interference method and system based on underdetermined blind source separation2021Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2021Patents assigned to UNIV GUANGDONG TECHNOLOGY (3)· patent assignee history
2021Patents assigned to GUANDONG UNIV OF TECHNOLOGY (1)· patent assignee history
2021Based in Guangzhou, CN· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| UNIV GUANGDONG TECHNOLOGY | 3 | 2021 |
| GUANDONG UNIV OF TECHNOLOGY | 1 | 2021 |
Locations
| Location | Patents | Span |
|---|---|---|
| Guangzhou, CN | 3 | 2021 |