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Inventor

Alexander Krymski

Inventor
Montrose, CA, US

Overview

69→
Patents
2000–2021
Patent span
Electricity
Primary field (CPC H)

Patents· 69 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H04Nprimary
H04NPictorial communication, e.g. television56%
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation14%
H03MCoding11%
G01SRadio direction-finding5%
H01LSemiconductor devices4%
H03KPulse technique4%
G11CStatic stores3%
H03FAmplifiers2%
G05FSystems for regulating electric or magnetic variables1%
PatentTitleYear
11,011,560Image sensors, methods, and high dynamic range pixels with variable capacitance202110,057,523Image sensors and methods with multiple phase-locked loops and serializers20189,654,713'Image sensors, methods, and pixels with tri-level biased transfer gates'20179,578,267'Cameras and methods with data processing, memories, and an image sensor with multiple data ports'20179,369,648'Image sensors, methods, and pixels with tri-level biased transfer gates'20169,363,456'Image sensors and methods with multiple column readout lines for a column of pixels multiplexed together for output'20169,019,411'Image sensors and methods with pipelined readout'20158,847,809'Variable quantization ADC for image sensors'2014RE045094'Method of operating a CMOS APS pixel sensor'20148,785,831'Image sensors and methods with high speed global shutter pixels'20148,723,093'Image sensors and methods with shared control lines'20148,698,061'Image sensors, methods, and pixels with storage and transfer gates'20148,531,550'Method of operating an image sensor having a digital exposure circuit'2013RE044482'CMOS active image sensor with common pixel transistors and binning capability'20138,310,578'Image sensors and methods with column readout circuits'20128,218,051'Low-power signal chain for image sensors'20128,174,603'Image sensors and methods with antiblooming channels and two side driving of control signals'20128,054,209'Variable quantization ADC for image sensors'20118,054,339'Digital exposure circuit for an image sensor'20118,040,394'Digital exposure circuit for an image sensor'20117,986,363'High dynamic range imager with a rolling shutter'2011RE042292'Pinned photodiode photodetector with common pixel transistors and binning capability'20117,876,362'High speed CMOS image sensor circuits with block memory readout'20117,821,557'High speed sampling of signals in active pixel sensors using buffer circuitry'20107,804,438'Image sensors and dual ramp analog-to-digital converters and methods'2010RE041340'Pinned photodiode photodetector with common buffer transistor and binning capability'20107,697,051'Image sensor with pixels having multiple capacitive storage elements'20107,667,752'Semiconductor imaging sensor array devices with dual-port digital readout'20107,659,925'High speed CMOS image sensor circuits with memory readout'20107,646,407'Digital exposure circuit for an image sensor'20107,630,011'High-speed sampling of signals in active pixel sensors'20097,573,516'Look ahead rolling shutter system in CMOS sensors'20097,565,033'Apparatus and method for increasing readout speed of a solid state imager'20097,541,963'Variable quantization ADC for image sensors'20097,511,755'Low-power signal chair for image sensors'20097,488,928'Image sensor circuits and methods with multiple readout lines per column of pixel circuits'20097,471,324'Amplifier shared between two columns in CMOS sensor'20087,400,279'Circuits and methods with comparators allowing for offset reduction and decision operations'20087,397,509'High dynamic range imager with a rolling shutter'20087,375,748'Differential readout from pixels in CMOS sensor'20087,336,214'Analog to digital converter circuit with offset reduction and image sensor using the same'20087,319,218'Method and apparatus for pixel signal binning and interpolation in column circuits of a sensor circuit'20087,245,321'Readout circuit with gain and analog-to-digital conversion for image sensor'20077,230,645'Method of operating a CMOS APS pixel sensor'20077,209,166'Wide dynamic range operation for CMOS sensor with freeze-frame shutter'20077,205,522'Pixel circuit for image sensor'20077,154,075'Method and apparatus for pixel signal binning and interpolation in column circuits of a sensor circuit'20067,148,831'Variable quantization ADC for image sensors'20067,116,368'CMOS APS pixel sensor dynamic range increase'20067,116,366'CMOS aps pixel sensor dynamic range increase'20067,050,094'Wide dynamic range operation for CMOS sensor with freeze-frame shutter'20066,947,077'Fast and accurate adjustment of gain and exposure time for image sensors'20056,917,027'Method and apparatus for reducing kTC noise in an active pixel sensor (APS) device'20056,906,745'Digital exposure circuit for an image sensor'20056,885,396'Readout circuit with gain and analog-to-digital a conversion for image sensor'20056,873,364'Low-power signal chain for image sensors'20056,870,565'Semiconductor imaging sensor array devices with dual-port digital readout'20056,870,496'Low voltage analog-to-digital converters with internal reference voltage and offset'20056,809,766'Look ahead rolling shutter system in CMOS sensors'20046,794,214'Lock in pinned photodiode photodetector'20046,778,123'Calibration of A/D converters by reusing capacitors used for sampling'20046,750,485'Lock in pinned photodiode photodetector'20046,567,029'Low voltage analog-to-digital converters with internal reference voltage and offset'20036,476,751'Low voltage analog-to-digital converters with internal reference voltage and offset'20026,365,886'Smart column controls for high speed multi-resolution sensors'20026,184,721'CMOS voltage comparator capable of operating with small input voltage difference'20016,147,519'Low-voltage comparator with wide input voltage swing'20006,049,247'Low-voltage common source switched-capacitor amplifier'20006,043,690'Bidirectional follower for driving a capacitive load'2000

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2000–2002Patents assigned to PHOTOBIT CORP (6)· patent assignee history
2000–2012Based in Montrose, CA, US· patent location history
2003–2011Patents assigned to MICRON TECHNOLOGY INC (26)· patent assignee history
2004–2011Based in La Crescenta, CA, US· patent location history
2008–2021Patents assigned to KRYMSKI ALEXANDER (16)· patent assignee history
2008–2012Patents assigned to APTINA IMAGING CORP (9)· patent assignee history
2008–2015Based in Pasadena, CA, US· patent location history
2011–2014Patents assigned to ROUND ROCK RES LLC (8)· patent assignee history
2016–2021Based in Sunny Isles Beach, FL, US· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
MICRON TECHNOLOGY INC262003–2011
KRYMSKI ALEXANDERself162008–2021
APTINA IMAGING CORP92008–2012
ROUND ROCK RES LLC82011–2014
PHOTOBIT CORP62000–2002
Locations
LocationPatentsSpan
Montrose, California, US302000–2012
La Crescenta, California, US182004–2011
Pasadena, California, US152008–2015
Sunny Isles Beach, Florida, US62016–2021