Inventor
MING-YIH WANG
Inventor
TW
Overview
Patents· 20 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Lprimary
H01LSemiconductor devices27%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1027%
G01RMeasuring electric variables14%
H10DInorganic electric semiconductor devices11%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h107%
G06FElectric digital data processing5%
H10BElectronic memory devices5%
G01NInvestigating or analysing materials by determining their chemical or physical properties2%
G06TImage data processing or generation, in general2%
PatentTitleYear
12,536,357Systems and methods for modeling via defect202612,456,696Dummy stacked structures surrounding TSVs and method forming the same202512,293,959Through-circuit Vias in interconnect structures202512,248,022Method and apparatus for detecting defective logic devices202512,243,805Through-circuit vias in interconnect structures202512,131,992Semiconductor structure and method of manufacturing the same202412,014,997Dummy stacked structures surrounding TSVs and method forming the same202412,007,438Method and system for testing an integrated circuit202411,963,347One-time programmable memory device including anti-fuse element202411,852,682Circuit screening system and circuit screening method202311,830,806Semiconductor structure and method of manufacturing the same202311,830,832Semiconductor structure and manufacturing method thereof202311,675,004Method and apparatus for detecting defective logic devices202311,665,890One-time programmable memory device including anti-fuse element and manufacturing method thereof202311,616,002Through-circuit vias in interconnect structures202311,579,191Method and system for testing an integrated circuit202311,500,016Circuit screening system and circuit screening method202211,361,141Method and system for manufacturing a semiconductor device202211,309,258Semiconductor structure202211,199,508Failure analysis method with improved detection accuracy for advanced technology node2021Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2021–2026Patents assigned to TAIWAN SEMICONDUCTOR MFG CO LTD (20)· patent assignee history
2021–2026Based in TW· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TAIWAN SEMICONDUCTOR MFG CO LTD | 20 | 2021–2026 |
Locations
| Location | Patents | Span |
|---|---|---|
| TW | 20 | 2021–2026 |