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Inventor

Jon Lescrenier

Inventor
Dallas, TX, US

Overview

2→
Patents
2008–2015
Patent span
Physics
Primary field (CPC G)

Patents· 2 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G11Cprimary
G11CStatic stores100%
PatentTitleYear
9,208,902'Bitline leakage detection in memories'20157,324,391'Method for determining and classifying SRAM bit fail modes suitable for production test implementation and real time feedback'2008

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2008–2015Patents assigned to TEXAS INSTRUMENTS INC (2)· patent assignee history
2008–2015Based in Dallas, TX, US· patent location history
2015Patents assigned to DENG XIAOWEI (1)· patent assignee history
2015Patents assigned to LESCRENIER JON (1)· patent assignee history
2015Patents assigned to LOH WAH KIT (1)· patent assignee history
2015Patents assigned to PIOUS BEENA (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
TEXAS INSTRUMENTS INC22008–2015
DENG XIAOWEI12015
LESCRENIER JONself12015
LOH WAH KIT12015
PIOUS BEENA12015
Locations
LocationPatentsSpan
Dallas, Texas, US22008–2015