LexDanaLexDanabeta
Inventor

Masahiro Takizawa

Inventor
Tokyo, JP

Overview

78→
Patents
1984–2021
Patent span
Physics
Primary field (CPC G)

Patents· 78 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary
G01RMeasuring electric variables29%
A61BDiagnosis14%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h106%
G06TImage data processing or generation, in general5%
Y10TTechnical subjects covered by former us classification5%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests4%
G06FElectric digital data processing3%
H01JElectric discharge tubes or discharge lamps3%
B41JTypewriters3%
G05BControl or regulating systems in general3%
PatentTitleYear
11,080,825Magnetic resonance imaging apparatus and image processing method202111,073,587Nuclear magnetic resonance apparatus and body motion correction method202110,919,105Three-dimensional laminating and shaping apparatus and laminating and shaping method202110,573,491Device, manufacturing method, and exposure apparatus202010,429,461Magnetic resonance imaging device and timing misalignment detection method thereof201910,330,752Magnetic resonance imaging apparatus and method for setting RF shimming parameters201910,261,150Magnetic resonance imaging apparatus and processing method201910,162,027Magnetic resonance imaging apparatus and irradiation magnetic field distribution measurement method201810,156,615Magnetic resonance imaging apparatus, Q-value calculation method, and specific absorption rate management method201810,031,205Magnetic resonance imaging apparatus and magnetic resonance imaging method20189,864,021'Magnetic resonance imaging apparatus and operating method thereof'20189,853,495Discharge circuit, information processing apparatus, discharge method, and storage medium20179,714,994'Magnetic resonance imaging apparatus, and method for correcting measurement-space coordinates'20179,664,765'Magnetic resonance imaging apparatus and gradient magnetic field waveform estimation method'20179,606,205'Magnetic resonance imaging apparatus, RF shimming method, and magnetic resonance imaging method'20179,594,142'Magnetic resonance imaging apparatus and echo signal measurement method'20179,594,140'Magnetic resonance imaging apparatus and method for calculating correction value as application amount of refocusing pulse for UTE sequence'20179,535,146'Magnetic resonance imaging apparatus and magnetic resonance imaging method'20179,510,770'Magnetic resonance imaging apparatus and SAR estimation method'20169,513,356'Magnetic resonance imaging apparatus and reconstructed image acquisition method'20169,400,319'Magnetic resonance imaging apparatus and method for measuring irradiation magnetic field'20169,292,075'Information processing apparatus, method for controlling power state shift and clearing or not clearing a shift time measured'20169,213,240'Electron beam exposure method'20159,207,699'Electric power control system and electric power control apparatus'20159,116,434'Electron beam exposure method'20159,081,075'Magnetic resonance imaging apparatus and magnetic resonance imaging method'20159,064,303'Magnetic resonance imaging apparatus and magnetic resonance imaging method configured to correct specific region data based on benchmark slice'20158,855,392'Magnetic resonance imaging apparatus and synchronous measurement method'20148,758,514'Cluster type semiconductor processing apparatus'20148,749,852'Method of embedding a plurality of different two-dimensional codes in an image'20148,666,551'Semiconductor-processing apparatus equipped with robot diagnostic module'20148,594,766'Magnetic resonance imaging apparatus and method'20138,594,767'Magnetic resonance imaging apparatus and magnetic resonance imaging method'20138,587,306'Magnetic resonance imaging apparatus and multi-contrast acquiring method'20138,582,845'Magnetic resonance imaging apparatus and method of compensation for readout gradient magnetic field error'20138,493,599'Printing system, printing apparatus, printing method, and program for implementing the printing system and the printing method'20138,488,205'Method of embedding a plurality of different two-dimensional codes in an image'20138,466,679'Magnetic resonance imaging apparatus and method configured for susceptibility-emphasized imaging with improved signal-to-noise ratio'20138,344,729'Magnetic resonance imaging apparatus'20138,207,734'Parallel imaging in non-cartesian magnetic resonance imaging (MRI) and MRI apparatus realizing the same'20128,154,294'Magnetic resonance imaging apparatus and method for correcting error due to gradient magnetic field'20128,115,966'Method of embedding a plurality of different two-dimensional codes in an image'20128,041,450'Position sensor system for substrate transfer robot'20118,032,201'Magnetic resonance imaging device'20117,963,736'Wafer processing apparatus with wafer alignment device'20117,945,345'Semiconductor manufacturing apparatus'20117,899,557'Input signal analyzing system and control apparatus using same'20117,877,129'Magnetic resonance imaging apparatus and RF reception coil apparatus'20117,847,546'Magnetic resonance imaging apparatus'20107,832,353'Semiconductor manufacturing apparatus equipped with wafer inspection device and inspection techniques'20107,831,315'Method for controlling semiconductor-processing apparatus'20107,768,263'Magnetic resonance imaging apparatus and method'20107,635,979'Magnetic resonance imaging apparatus and method'20097,622,926'Magnetic resonance imaging apparatus'20097,618,226'Semiconductor substrate transfer apparatus and semiconductor substrate processing apparatus equipped with the same'20097,571,732'Ignition control of remote plasma unit'20097,498,809'Magnetic resonance imaging device with multiple RF coils applying half-pulse waveforms for selective excitation of a local region'20097,486,076'Magnetic resonance imaging apparatus and method with adjustment in positioning within imaging space to correct deviation from desired position'20097,372,269'Magnetic resonance imaging method and apparatus'20087,340,320'Method of recipe control operation'20087,315,913'CPU system, bus bridge, control method therefor, and computer system'20087,224,163'Magnetic resonance imaging device'20076,885,885'Magnetic resonance imaging method and device'20056,876,201'Magnetic resonance imaging apparatus and method'20056,777,934'Magnetic resonance imaging method and apparatus'20046,541,970'Nuclear magnetic resonance imaging method and device'20036,499,834'Inkjet printhead having a substrate with advantageously ordered signal processing circuits'20026,331,048'Inkjet printhead having multiple ink supply holes'20016,143,190'Method of producing a through-hole, silicon substrate having a through-hole, device using such a substrate, method of producing an ink-jet print head, and ink-jet print head'20006,118,273'Magnetic resonance imaging method and device therefor'20005,631,457'Two-dimensional symbol data read apparatus'19974,908,233'Production of microcapsules by simple coacervation'19904,777,089'Microcapsule containing hydrous composition'19884,749,501'Solid soap composition containing microencapsulated hydrophobic liquids'19884,673,622'Magnetic recording medium'19874,632,870'Magnetic recording medium'19864,579,780'Magnetic recording medium'19864,452,863'Magnetic recording medium'1984

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1988–2021Based in Tokyo, JP· patent location history
2000–2016Patents assigned to HITACHI MEDICAL CORP (27)· patent assignee history
2000–2017Patents assigned to CANON KK (11)· patent assignee history
2000–2011Based in Kashiwa, JP· patent location history
2001–2017Based in Kawasaki, JP· patent location history
2005–2011Based in Chiba, JP· patent location history
2008–2014Patents assigned to ASM JAPAN (11)· patent assignee history
2008–2014Based in Tama, JP· patent location history
2012–2017Patents assigned to TAKIZAWA MASAHIRO (24)· patent assignee history
2016–2021Patents assigned to HITACHI LTD (17)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
HITACHI MEDICAL CORP272000–2016
TAKIZAWA MASAHIROself242012–2017
HITACHI LTD172016–2021
ASM JAPAN112008–2014
CANON KK112000–2017
Locations
LocationPatentsSpan
Tokyo, JP401988–2021
Kashiwa, JP72000–2011
Chiba, JP72005–2011
Kawasaki, JP62001–2017
Tama, JP62008–2014