Inventor
Yoshiro Asano
Inventor
Tokyo, JP
Overview
Patents· 46 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
LOC10primary
LOC1037%
G03BApparatus or arrangements for taking photographs or for projecting or viewing them15%
F21VFunctional features or details of lighting devices or systems thereof7%
H04NPictorial communication, e.g. television7%
LOC166%
F21YIndexing scheme associated with subclasses f21k, f21l, f21s and f21v, relating to the form or the kind of the light sources or of the colour of the light emitted4%
G02BOptical elements, systems or apparatus3%
LOC083%
C09KMaterials for miscellaneous applications, not provided for elsewhere1%
F16CShafts1%
PatentTitleYear
10,920,825Motion guide device load measuring system and load measuring method, and motion guide device service life calculating method2021D0893327Micrometer202010,663,121Light-emitting device, light source unit, and projection display apparatus202010,606,155Light source device and image display device202010,578,957Fluorescent substrate, light source device, and projection display unit2020D0870795Variable focal length lens2019D0869542Variable focal length lens2019D0848883Hardness tester2019D0848882Hardness tester2019D0848867Display device for hardness tester2019D0847675Hardness tester2019D0847676Hardness tester2019D0847674Hardness tester201910,185,213Fluorescent substrate, light source device, and projection display unit2019D0829261Variable focal length lens20189,857,671'Light source device and image display device'20189,829,776Light source device and image display device2017D0774928'Caliper'20169,372,059'Micrometer'2016D0744573'Camera for remote coordinate measuring machine'20159,197,869'Video display device and cooling system'2015D0740143'Micrometer'20159,152,024'Video display device and cooling system'20159,054,481'Cooling device and semiconductor laser device'2015D0729659'Micrometer'2015D0721291'Calipers'2015D0712761'Measuring head'2014D0709777'Optical measurement head for measuring coordinates'2014D0678033'Stand for a micrometer'2013D0678090'Stand for a micrometer'2013D0670585'Inside diameter measurement tool'2012D0659572'Measuring head'2012D0659575'Measuring head'2012D0659574'Measuring head'2012D0657654'Knob for a stand for measuring instruments'20128,123,362'Lamp burst sound reduction structure and projector'2012D0653134'Heat-insulating cover for micrometer'2012D0614053'Surface-roughness measurement instrument'2010D0611850'Caliper'2010D0611371'Micrometer'2010D0611370'Caliper'2010D0610928'Caliper'20107,625,106'Heat radiating structure for use in image projecting apparatus'20097,320,523'Liquid-cooled liquid crystal panel and method of manufacturing the same as well as liquid crystal projector'2008D0444083'Component part of a caliper'2001D0260084'Food temperature sensing probe assembly'1981Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1981Based in Saitama, JP· patent location history
2001–2020Patents assigned to MITUTOYO CORP (32)· patent assignee history
2001–2021Based in Tokyo, JP· patent location history
2008–2020Patents assigned to SONY CORP (11)· patent assignee history
2008–2012Based in Chiba, JP· patent location history
2012–2013Patents assigned to ASANO YOSHIRO (9)· patent assignee history
2012–2013Patents assigned to OHTANI SHIGERU (8)· patent assignee history
2012–2013Patents assigned to MATSUMIYA SADAYUKI (6)· patent assignee history
2015–2020Based in Kanagawa, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| MITUTOYO CORP | 32 | 2001–2020 |
| SONY CORP | 11 | 2008–2020 |
| ASANO YOSHIROself | 9 | 2012–2013 |
| OHTANI SHIGERU | 8 | 2012–2013 |
| MATSUMIYA SADAYUKI | 6 | 2012–2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 33 | 2001–2021 |
| Kanagawa, JP | 9 | 2015–2020 |
| Chiba, JP | 3 | 2008–2012 |
| Saitama, JP | 1 | 1981 |