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Inventor

Tae Heung Ahn

Inventor
Seoul, KR

Overview

3→
Patents
2018–2020
Patent span
Physics
Primary field (CPC G)

Patents· 3 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties27%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1018%
G01BMeasuring length, thickness or similar linear dimensions9%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light9%
G01RMeasuring electric variables9%
G06TImage data processing or generation, in general9%
H01LSemiconductor devices9%
H04NPictorial communication, e.g. television9%
PatentTitleYear
10,733,719Wafer inspection apparatus and wafer inspection method using the same202010,473,579Apparatus for inspecting material property of plurality of measurement objects201910,001,444Surface inspecting method2018

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2018–2020Patents assigned to SAMSUNG ELECTRONICS CO LTD (3)· patent assignee history
2018–2020Based in Seoul, KR· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
SAMSUNG ELECTRONICS CO LTD32018–2020
Locations
LocationPatentsSpan
Seoul, KR32018–2020