Inventor
Shih-Hsien Yang
Inventor
Hsinchu, TW
Overview
Patents· 22 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G06Fprimary
G06FElectric digital data processing23%
G11CStatic stores13%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1013%
H01LSemiconductor devices6%
H04LTransmission of digital information, e.g. telegraphic communication6%
H10DInorganic electric semiconductor devices6%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h106%
LOC146%
B65DContainers for storage or transport of articles or materials, e.g. bags, barrels, bottles, boxes, cans, cartons, crates, drums, jars, tanks, hoppers, forwarding containers3%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light3%
PatentTitleYear
11,054,933Touch sensor circuit and touch sensor method20219,583,564'Isolation structure'20179,400,866'Layout modification method and system'20169,218,061'Video frame synchronization for a federation of projectors using camera feedback'20159,184,154'Methods for fabricating integrated passive devices on glass substrates'20159,126,710'Carton'20159,122,839'Layout modification method and system'20158,826,195'Layout modification method and system'20148,405,536'Communication system for frequency shift keying signal'20137,830,990'Method for estimating and compensating frequency offset and frequency offset estimation module'20107,793,130'Mother/daughter switch design with self power-up control'20107,317,520'Method and apparatus for measuring brightness'2008D0516048'Photographable flip-up mobile phone'2006D0508902'Mobile phone having rotatable camera'20056,862,219'Weak programming method of non-volatile memory'20056,847,557'Method of erasing non-volatile memory data'20056,845,347'Method for modeling an integrated circuit including a DRAM cell'20056,828,219'Stacked spacer structure and process'20046,776,622'Conductive contact structure and process for producing the same'20046,377,067'Testing method for buried strap and deep trench leakage current'20026,185,125'Circuit for measuring the data retention time of a dynamic random-access memory cell'20016,055,195'Delay circuit and delay chain circuit for measurement of the charge/discharge period of dynamic random access memory'2000Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2000–2005Patents assigned to WINBOND ELECTRONICS CORP (8)· patent assignee history
2000–2005Based in Taoyuan, TW· patent location history
2002–2021Based in Hsinchu, TW· patent location history
2005–2010Based in Taichung, TW· patent location history
2006–2008Patents assigned to ASIA OPTICAL CO INC (2)· patent assignee history
2010–2015Patents assigned to TAIWAN SEMICONDUCTOR MFG (3)· patent assignee history
2013–2015Patents assigned to YANG SHIH-HSIEN (3)· patent assignee history
2015–2017Patents assigned to TAIWAN SEMICONDUCTOR MFG CO LTD (3)· patent assignee history
2015–2017Based in Zhubei City, TW· patent location history
2015Based in Irvine, CA, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| WINBOND ELECTRONICS CORP | 8 | 2000–2005 |
| TAIWAN SEMICONDUCTOR MFG | 3 | 2010–2015 |
| TAIWAN SEMICONDUCTOR MFG CO LTD | 3 | 2015–2017 |
| YANG SHIH-HSIENself | 3 | 2013–2015 |
| ASIA OPTICAL CO INC | 2 | 2006–2008 |
Locations
| Location | Patents | Span |
|---|---|---|
| Hsinchu, TW | 11 | 2002–2021 |
| Taichung, TW | 4 | 2005–2010 |
| Taoyuan, TW | 3 | 2000–2005 |
| Zhubei City, TW | 2 | 2015–2017 |
| Irvine, California, US | 1 | 2015 |