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Inventor

Itaru Takao

Inventor
Yamanashi, JP

Overview

7→
Patents
1990–1995
Patent span
Electricity
Primary field (CPC H)

Patents· 7 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H10Pprimary
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1044%
B25BTools or bench devices not otherwise provided for, for fastening, connecting, disengaging, or holding22%
G01RMeasuring electric variables22%
Y10TTechnical subjects covered by former us classification11%
PatentTitleYear
5,410,259'Probing device setting a probe card parallel'1995D0350490'Semiconductor wafer testing apparatus'19945,086,270'Probe apparatus'1992D0323628'Semiconductor wafer measuring instrument'19925,065,495'Method for holding a plate-like member'19914,955,590'Plate-like member receiving apparatus'19904,941,800'Transfer apparatus for plate-like member'1990

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1990–1995Patents assigned to TOKYO ELECTRON LTD (7)· patent assignee history
1990–1995Based in Yamanashi, JP· patent location history
1994–1995Patents assigned to TEL YAMANISHI KK (2)· patent assignee history
1994Based in Nirasaki, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
TOKYO ELECTRON LTD71990–1995
TEL YAMANISHI KK21994–1995
Locations
LocationPatentsSpan
Yamanashi, JP61990–1995
Nirasaki, JP11994