Inventor
Chi-Chan Hsu
Inventor
Hsinchu, TW
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables44%
G06FElectric digital data processing11%
H01LSemiconductor devices11%
H10BElectronic memory devices11%
H10DInorganic electric semiconductor devices11%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1011%
PatentTitleYear
11,127,752Structure of semiconductor device and method for fabricating the same20217,904,773'Multiple-capture DFT system for scan-based integrated circuits'20117,444,567'Method and apparatus for unifying self-test with scan-test during prototype debug and production test'20087,191,373'Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (DFD) techniques'20076,954,887'Multiple-capture DFT system for scan-based integrated circuits'2005Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2005–2011Patents assigned to SYNTEST TECHNOLOGIES INC (4)· patent assignee history
2005–2011Based in Hsinchu, TW· patent location history
2021Patents assigned to UNITED MICROELECTRONICS CORP (1)· patent assignee history
2021Based in Yunlin County, TW· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| SYNTEST TECHNOLOGIES INC | 4 | 2005–2011 |
| UNITED MICROELECTRONICS CORP | 1 | 2021 |
Locations
| Location | Patents | Span |
|---|---|---|
| Hsinchu, TW | 4 | 2005–2011 |
| Yunlin County, TW | 1 | 2021 |