Inventor
Stephan Wagner-Conrad
Inventor
Jena, DE
Overview
Patents· 3 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G02Bprimary
G02BOptical elements, systems or apparatus50%
G01NInvestigating or analysing materials by determining their chemical or physical properties25%
G06TImage data processing or generation, in general25%
PatentTitleYear
8,892,400'Method for evaluating fluorescence correlation spectroscopy measurement data'20148,654,128'Method and arrangement for outputting residual errors for a function customized to a set of points'20148,120,771'Configuration of a laser scanning microscope for raster image correlation spectroscopy measurement and method for conducting and evaluating such a measurement'2012Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2012–2014Patents assigned to WAGNER-CONRAD STEPHAN (3)· patent assignee history
2012–2014Patents assigned to WEISSHART KLAUS (3)· patent assignee history
2012Patents assigned to HECHT FRANK (1)· patent assignee history
2012–2014Based in Jena, DE· patent location history
2014Patents assigned to ZEISS CARL MICROSCOPY GMBH (2)· patent assignee history
2014Patents assigned to HEIDKAMP MARCUS (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| WAGNER-CONRAD STEPHANself | 3 | 2012–2014 |
| WEISSHART KLAUS | 3 | 2012–2014 |
| ZEISS CARL MICROSCOPY GMBH | 2 | 2014 |
| HECHT FRANK | 1 | 2012 |
| HEIDKAMP MARCUS | 1 | 2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Jena, DE | 3 | 2012–2014 |