Inventor
Wenjian Cai
Inventor
Sunnyvale, CA, US
Overview
Patents· 9 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties50%
G02BOptical elements, systems or apparatus28%
G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein11%
G06TImage data processing or generation, in general11%
PatentTitleYear
10,060,884Interleaved acousto-optical device scanning for suppression of optical crosstalk20189,970,883Multi-spot scanning collection optics20189,864,173'Systems and methods for run-time alignment of a spot scanning wafer inspection system'20189,645,093'System and method for apodization in a semiconductor device inspection system'20179,546,962'Multi-spot scanning collection optics'20179,395,340'Interleaved acousto-optical device scanning for suppression of optical crosstalk'20169,208,553'Image synchronization of scanning wafer inspection system'20159,176,069'System and method for apodization in a semiconductor device inspection system'20158,995,746'Image synchronization of scanning wafer inspection system'2015Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2015–2018Patents assigned to KLA TENCOR CORP (9)· patent assignee history
2015Patents assigned to KLA—TENCOR CORP (1)· patent assignee history
2015–2018Based in Sunnyvale, CA, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| KLA TENCOR CORP | 9 | 2015–2018 |
| KLA—TENCOR CORP | 1 | 2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| Sunnyvale, California, US | 9 | 2015–2018 |