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Inventor

Todd Blalock

Inventor
Penfield, NY, US

Overview

6→
Patents
2007–2014
Patent span
Physics
Primary field (CPC G)

Patents· 6 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions33%
A61BDiagnosis25%
G01DMeasuring not specially adapted for a specific variable8%
G01KMeasuring temperature8%
G01MTesting static or dynamic balance of machines or structures8%
G06KGraphical data reading8%
G06VImage or video recognition or understanding8%
PatentTitleYear
8,836,778'Portable fundus camera'20148,279,446'Fiber-based interferometric device for measuring axial dimensions of a human eye'20128,199,329'Apparatus for measurement of the axial length of an eye'20127,884,946'Apparatus for measurement of the axial length of an eye'20117,675,618'Multiplexing spectrometer'20107,206,076'Thickness measurement of moving webs and seal integrity system using dual interferometer'2007

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2007–2014Patents assigned to LUMETRICS INC (5)· patent assignee history
2007–2014Based in Penfield, NY, US· patent location history
2010Patents assigned to ASE OPTICS INC (1)· patent assignee history
2012–2014Patents assigned to IGNATOVICH FILIPP V (3)· patent assignee history
2012–2014Patents assigned to BLALOCK TODD (2)· patent assignee history
2012Patents assigned to BLALOCK TODD F (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
LUMETRICS INC52007–2014
IGNATOVICH FILIPP V32012–2014
BLALOCK TODDself22012–2014
ASE OPTICS INC12010
BLALOCK TODD Fself12012
Locations
LocationPatentsSpan
Penfield, New York, US62007–2014