Inventor

Norikazu Yamada

Inventor
Kanagawa, JP

Overview

42→
Patents
1992–2020
Patent span
Electricity
Primary field (CPC H)

Patents· 42 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H01Jprimary
H01JElectric discharge tubes or discharge lamps23%
H04NPictorial communication, e.g. television14%
G03GElectrography11%
G06FElectric digital data processing8%
H05HPlasma technique8%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h106%
B41JTypewriters4%
B65HHandling thin or filamentary material, e.g. sheets, webs, cables4%
H03HImpedance networks, e.g. resonant circuits4%
G01RMeasuring electric variables3%
PatentTitleYear
10,615,005Plasma generating method202010,593,519Plasma processing apparatus202010,388,544Substrate processing apparatus and substrate processing method201910,250,217Method for impedance matching of plasma processing apparatus201910,109,461Plasma processing method201810,060,834Failure prediction apparatus and failure prediction system201810,032,611Connection control method20189,986,120Environment management apparatus for inside of machine, electronic machine, image forming apparatus, environment management method for inside of machine, and non-transitory computer readable medium20189,875,881Plasma processing apparatus and plasma processing method20189,754,768'Plasma processing method and plasma processing apparatus'20179,736,921'Method for impedance matching of plasma processing apparatus'20179,734,992'Plasma processing apparatus'20179,564,287'Substrate processing apparatus and substrate processing method using same'20179,355,822'Plasma processing apparatus'20169,244,803'Failure predictive system, and failure predictive apparatus'20168,821,684'Substrate plasma processing apparatus and plasma processing method'20148,568,606'Substrate processing apparatus and substrate processing method using same'20138,403,448'Medium transport device, control program for medium transport device and control method for medium transport device'20138,405,870'Method and apparatus for detecting defects in an image forming apparatus'20138,355,641'Paper wrinkle sign monitoring device, paper wrinkle sign monitoring method, and computer readable medium'20138,326,564'Detected data processing apparatus and computer readable medium for detecting data'20128,290,893'Failure diagnosis system, a failure diagnosis device, an information update device, and a computer-readable medium'20128,288,286'Dry-etching method'20128,132,049'Failure diagnosis method, failure diagnosis apparatus, conveyance device, image forming apparatus, program, and storage medium'20128,091,884'Transport device, overlap feed sign detection device, and computer readable medium'20127,489,881'Failure prevention diagnosis support system, failure prevention diagnosis support method, and program product of failure prevention diagnosis support'20097,476,624'Dry-etching method'20097,403,870'Trouble sensing device'20087,324,909'Fault diagnosis apparatus'20087,275,009'Fault diagnosis apparatus'20077,250,781'Circuit board inspection device'20077,243,045'Failure diagnosis method, failure diagnosis apparatus, image forming apparatus, program, and storage medium'20077,239,738'Image defect inspecting apparatus and image defect inspecting method'20077,174,264'Fault diagnosis apparatus'20077,076,086'Image inspection device'20067,003,258'Transfer device, transfer method and image forming device'20066,842,854'METHOD PROGRAMMABLE LOGIC DEVICE, INFORMATION PROCESSING SYSTEM AND METHOD OF RECONFIGURING CIRCUIT FOR SEQUENTIALLY PROCESSING DATA IN BLOCKS AND TEMPORARILY STORING DATA PROCESSED UNTIL NEXT CONFIGURATION'20056,336,209'Information processing system that processes portions of an application program using programmable logic circuits'20025,539,458'TFT-drive image sensor capable of producing an offset-free image signal'19965,485,206'Method of driving image sensor and image sensor'19965,164,580'Electroluminescent light-source-incorporated image sensor'19925,101,099'Image reading device with different reflectivity coefficients in a transparent layer and a substrate'1992

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1992–2018Patents assigned to FUJI XEROX CO LTD (26)· patent assignee history
1992–2018Based in Kanagawa, JP· patent location history
2002–2006Based in Nakai-machi, JP· patent location history
2009–2020Patents assigned to TOKYO ELECTRON LTD (16)· patent assignee history
2009–2014Based in Nirasaki, JP· patent location history
2012–2014Patents assigned to YAMADA NORIKAZU (10)· patent assignee history
2012–2013Patents assigned to YASUKAWA KAORU (7)· patent assignee history
2012–2013Patents assigned to ADACHI KOJI (6)· patent assignee history
2012–2019Based in Yamanashi, JP· patent location history
2016–2020Based in Miyagi, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
FUJI XEROX CO LTD261992–2018
TOKYO ELECTRON LTD162009–2020
YAMADA NORIKAZUself102012–2014
YASUKAWA KAORU72012–2013
ADACHI KOJI62012–2013
Locations
LocationPatentsSpan
Kanagawa, JP201992–2018
Miyagi, JP102016–2020
Yamanashi, JP32012–2019
Nirasaki, JP32009–2014
Nakai-machi, JP32002–2006