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Inventor

Tilo Jankowski

Inventor
Berlin, DE

Overview

3→
Patents
2008–2015
Patent span
Physics
Primary field (CPC G)

Patents· 3 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties33%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light17%
G01KMeasuring temperature17%
G01QScanning-probe techniques or apparatus17%
G02BOptical elements, systems or apparatus17%
PatentTitleYear
9,080,937'Apparatus and a method for investigating a sample by means of several investigation methods'20157,703,978'Temperature measuring device'20107,456,026'Imaging fluorescence correlation spectroscopy for analysis of molecular interactions in low volumes'2008

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2008Patents assigned to ZEISS CARL MICROIMAGING GMBH (1)· patent assignee history
2008Based in Gueterfelde, DE· patent location history
2010Patents assigned to RAYTEK GMBH (1)· patent assignee history
2010–2015Based in Berlin, DE· patent location history
2015Patents assigned to JPK INSTRUMENTS AG (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
JPK INSTRUMENTS AG12015
RAYTEK GMBH12010
ZEISS CARL MICROIMAGING GMBH12008
Locations
LocationPatentsSpan
Berlin, DE22010–2015
Gueterfelde, DE12008