Inventor
Lester L. Wilson
Inventor
Sherman, TX, US
Overview
Patents· 11 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables50%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1030%
Y10TTechnical subjects covered by former us classification10%
B28DWorking stone or stone-like materials5%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h105%
PatentTitleYear
7,898,275'Known good die using existing process infrastructure'20117,122,895'Stud-cone bump for probe tips used in known good die carriers'20066,906,539'High density, area array probe card apparatus'20056,720,574'Method of testing a semiconductor chip'20046,720,780'High density probe card apparatus and method of manufacture'20046,636,063'Probe card with contact apparatus and method of manufacture'20036,553,661'Semiconductor test structure having a laser defined current carrying structure'20036,489,673'Digital signal processor/known good die packaging using rerouted existing package for test and burn-in carriers'20026,376,352'Stud-cone bump for probe tips used in known good die carriers'20026,335,226'Digital signal processor/known good die packaging using rerouted existing package for test and burn-in carriers'20026,209,532'Soft handling process tooling for low and medium volume known good die product'2001Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2001–2011Patents assigned to TEXAS INSTRUMENTS INC (11)· patent assignee history
2001–2011Based in Sherman, TX, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TEXAS INSTRUMENTS INC | 11 | 2001–2011 |
Locations
| Location | Patents | Span |
|---|---|---|
| Sherman, Texas, US | 11 | 2001–2011 |