Inventor
Hiromu Inoue
Inventor
Kanagawa, JP
Overview
Patents· 33 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties21%
G01BMeasuring length, thickness or similar linear dimensions14%
G06TImage data processing or generation, in general12%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices11%
B60JWindows, windscreens, non-fixed roofs, doors, or similar devices for vehicles5%
B60RVehicles, vehicle fittings, or vehicle parts, not otherwise provided for5%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h105%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests5%
H01BCables2%
H05KPrinted circuits2%
PatentTitleYear
10,572,995Inspection method and inspection apparatus202010,298,000Door hole seal for automobile201910,232,689Vehicular door structure201910,197,507Inspection apparatus20199,841,385'Pattern characteristic-detection apparatus for photomask and pattern characteristic-detection method for photomask'20179,764,625'Vehicle door'20179,691,143'Inspection apparatus and inspection apparatus system'20179,645,488'Position measuring method, misplacement map generating method, and inspection system'20179,557,277'Inspection apparatus and inspection method'20179,539,884'Door sash'20179,460,502'Defect inspection apparatus using images obtained by optical path adjusted'20169,406,117'Inspection system and method for inspecting line width and/or positional errors of a pattern'20169,290,971'Door device for vehicle'20169,207,189'Sample support apparatus'20159,194,817'Defect detection method'20159,116,136'Inspection method and system'20159,036,896'Inspection system and method for inspecting line width and/or positional errors of a pattern'20158,761,518'Pattern inspection apparatus'20148,358,340'Pattern inspection device and method of inspecting pattern'20137,466,854'Size checking method and apparatus'20087,394,048'Focusing device, focusing method and a pattern inspecting apparatus'20087,378,201'Method for repairing a photomask, method for inspecting a photomask, method for manufacturing a photomask, and method for manufacturing a semiconductor device'20087,304,730'Inspection apparatus having two sensors, method for inspecting an object, and a method for manufacturing a photolithography mask'20077,070,889'Method for repairing a photomask, method for inspecting a photomask, method for manufacturing a photomask, and method for manufacturing a semiconductor device'20066,965,687'Size checking method and apparatus'20056,888,958'Method and apparatus for inspecting patterns'20056,849,363'Method for repairing a photomask, method for inspecting a photomask, method for manufacturing a photomask, and method for manufacturing a semiconductor device'20056,656,648'Pattern inspection apparatus, pattern inspection method and mask manufacturing method'20035,574,800'Pattern defect inspection method and apparatus'19965,204,025'Conductive paste composition'19934,921,623'Copper conductive coating composition'19904,922,166'Electron gun for multigun cathode ray tube'19904,904,310'Method of generating a metal vapor in a metal vapor laser'1990Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1996–2017Patents assigned to TOSHIBA KK (15)· patent assignee history
1996–2020Based in Yokohama, JP· patent location history
2007–2019Based in Kanagawa, JP· patent location history
2008–2020Patents assigned to NUFLARE TECHNOLOGY INC (11)· patent assignee history
2013–2017Patents assigned to INOUE HIROMU (5)· patent assignee history
2013–2017Patents assigned to IKEDA HIROYUKI (3)· patent assignee history
2016–2019Patents assigned to HONDA MOTOR CO LTD (5)· patent assignee history
2016–2019Based in Wako, JP· patent location history
2017Based in Saitama, JP· patent location history
2019Based in Shioya-gun, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TOSHIBA KK | 15 | 1996–2017 |
| NUFLARE TECHNOLOGY INC | 11 | 2008–2020 |
| HONDA MOTOR CO LTD | 5 | 2016–2019 |
| INOUE HIROMUself | 5 | 2013–2017 |
| IKEDA HIROYUKI | 3 | 2013–2017 |
Locations
| Location | Patents | Span |
|---|---|---|
| Kanagawa, JP | 13 | 2007–2019 |
| Yokohama, JP | 11 | 1996–2020 |
| Wako, JP | 2 | 2016–2019 |
| Saitama, JP | 2 | 2017 |
| Shioya-gun, JP | 1 | 2019 |