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Inventor

Kunihiko Gotoh

Inventor
Kawasaki, JP

Overview

54→
Patents
1985–2014
Patent span
Electricity
Primary field (CPC H)

Patents· 54 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H03Mprimary
H03MCoding16%
H03KPulse technique13%
H03FAmplifiers12%
H03LAutomatic control, starting, synchronisation or stabilisation of generators of electronic oscillations or pulses7%
G05FSystems for regulating electric or magnetic variables6%
G11CStatic stores6%
H03GControl of amplification5%
H10DInorganic electric semiconductor devices5%
H02MApparatus for conversion between ac and ac, between ac and dc, or between dc and dc, and for use with mains or similar power supply systems4%
H03HImpedance networks, e.g. resonant circuits4%
PatentTitleYear
8,692,616'Operational amplifier, analog arithmetic circuit, and analog to digital converter'20148,629,797'Switched capacitor circuit and stage circuit for AD converter'20147,986,258'Analog-digital conversion cell and analog-digital converter'20117,907,076'Differential amplifier circuit amplifying differential signals with selectively switching between differential signals and AD converter apparatus'20117,880,532'Reference voltage generating circuit'20117,855,596'Demodulation circuit'20107,732,945'Rectifier circuit'20107,642,840'Reference voltage generator circuit'20107,589,587'Feedback amplifier circuit operable at low voltage by utilizing switched operational amplifier and chopper modulator'20097,456,774'Encoder circuit and A/D conversion circuit'20087,301,399'Class AB CMOS output circuit equipped with CMOS circuit operating by predetermined operating current'20077,271,757'Encoder circuit and A/D conversion circuit'20077,068,548'Semiconductor integrated circuit with noise reduction circuit'20066,998,917'Common-mode feedback circuit and differential operational amplifier circuit having stable operation and low power consumption'20066,936,889'Semiconductor device and method for testing semiconductor device'20056,822,599'Integrated circuit and A/D conversion circuit'20046,740,929'Semiconductor device and method for testing semiconductor device'2004D0483096'Pipe coupling socket'2003D0482761'Pipe coupling plug'20036,646,860'Capacitor and method for fabricating the same'20036,528,817'Semiconductor device and method for testing semiconductor device'20036,433,407'Semiconductor integrated circuit'20026,366,767'Local oscillation circuit and a receiving circuit including the local oscillation circuit'20026,342,818'PLL having switching circuit for maintaining lock during loss of input signal'20026,307,427'Filter characteristic regulating apparatus and regulating method therefor'20016,211,746'Integration method and integration circuit offering improved signal-to-noise ratio, and voltage-controlled oscillator and frequency-voltage converter employing integration circuit'20016,100,766'Correction circuit controlling sensitivities of an oscillator circuit and electronic device using the same'20006,064,243'Current switch and PLL in which it is used'20005,955,925'Digital AGC circuit'19995,861,771'Regulator circuit and semiconductor integrated circuit device having the same'19995,793,257'Oscillator having switching capacitors and phase-locked loop employing same'19985,684,874'Ringtrip judging circuit'19975,650,652'Input/output protection circuit and semiconductor device having the same'19975,633,939'Compander circuit'19975,585,795'D/A converter including output buffer having a controllable offset voltage'19965,579,214'Half-wave rectifier circuit'19965,523,721'Digitally controlled variable gain circuit'19965,351,860'Coupling for breaking a seal film of a dispensing opening for a fluid-filled container'19945,351,030'Variable attenuator for attenuating gain of analog signal in accordance with digital signal'19945,319,345'Variable resistor'19945,261,677'Seal ring'19935,252,975'Digital-to-analog converter having resistor networks'19935,155,385'Semiconductor integrated circuit device having a bias supply current'19925,059,890'Constant current source circuit'19914,914,400'Differential amplifier circuit improved to shorten a circuit recovery time thereof'19904,912,425'Operational amplifier circuit having stable operating point'19904,835,417'Comparator circuit having improved output characteristics'19894,808,852'Input circuit having level shift'19894,760,376'Electronic conversion circuit'19884,743,885'Cyclic type D/A converter having error detection and correction system'19884,730,129'Integrated circuit having fuse circuit'19884,697,140'Semiconductor integrated circuit having a test circuit for testing an internal circuit'19874,697,154'Semiconductor integrated circuit having improved load drive characteristics'19874,536,949'Method for fabricating an integrated circuit with multi-layer wiring having opening for fuse'1985

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1985–2014Patents assigned to FUJITSU LTD (46)· patent assignee history
1985–1990Based in Kunitachi, JP· patent location history
1990–2004Based in Tama, JP· patent location history
1992Patents assigned to FUJITSU VLSI LTD (1)· patent assignee history
1993–2003Patents assigned to NITTO KOHKI CO (3)· patent assignee history
1993–2014Based in Kawasaki, JP· patent location history
1993–2003Based in Tokyo, JP· patent location history
2007–2011Patents assigned to SEMICONDUCTOR TECH ACAD RES CT (3)· patent assignee history
2009–2011Based in Kanagawa, JP· patent location history
2014Patents assigned to FUJTISU LTD (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
FUJITSU LTD461985–2014
NITTO KOHKI CO31993–2003
SEMICONDUCTOR TECH ACAD RES CT32007–2011
FUJITSU VLSI LTD11992
FUJTISU LTD12014
Locations
LocationPatentsSpan
Kawasaki, JP331993–2014
Kunitachi, JP91985–1990
Tama, JP61990–2004
Tokyo, JP41993–2003
Kanagawa, JP22009–2011