Inventor
Hiroya Fukuyama
Inventor
Machida, JP
Overview
Patents· 24 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G02Bprimary
G02BOptical elements, systems or apparatus57%
A61BDiagnosis11%
G01NInvestigating or analysing materials by determining their chemical or physical properties11%
B82YSpecific uses or applications of nanostructures5%
H04NPictorial communication, e.g. television5%
B08BCleaning in general3%
G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein3%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices3%
H01JElectric discharge tubes or discharge lamps3%
PatentTitleYear
11,096,572Scanning optical system and observation apparatus202110,492,667Optical fiber scanning apparatus and optical scanning type endoscope201910,422,747Imaging optical system, illumination apparatus, observation apparatus, and wavefront recovery device201910,330,905Pair of phase modulation elements for imaging optical system, imaging optical system, illuminating device, and microscope apparatus201910,168,283Observation apparatus and method for sharpening final image201910,108,008Image-forming optical system, illumination apparatus, and observation apparatus20189,513,223'Scanning observation apparatus'20169,055,866'Internal observation device for object having light scattering properties, internal body observation device, endoscope for internal observation and internal observation method'20158,169,724'Objective lens adapter'20128,129,687'Lighting system, method of lighting, optical detector, and method of optical detection'20128,119,960'Light emitting type lighting system, method of light emitting type lighting, and scanning optical microscope'20127,782,528'Microscope examination apparatus'20107,643,209'Microscope optical system, microscope apparatus, and microscope observation method'20107,450,325'Objective-lens protector, objective-lens treatment method, and objective-lens cleaner'20087,304,789'Microscope system and objective unit'20077,233,437'Laser-scanning microscope'20077,224,523'Scanning optical microscope'20077,002,736'Scanning optical microscope'20066,774,944'Image taking apparatus'20046,751,016'Scanning optical microscope'20046,710,938'Objective scanning microscope'20046,515,734'Exposure apparatus'20035,334,830'Scanning optical microscope having a compact confocal optical system for adjusting position of aperture'19945,225,671'Confocal optical apparatus'1993Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1993–2004Patents assigned to OLYMPUS OPTICAL CO (4)· patent assignee history
1993–2019Based in Tokyo, JP· patent location history
1994–2007Based in Sagamihara, JP· patent location history
2004–2021Patents assigned to OLYMPUS CORP (20)· patent assignee history
2007–2021Based in Machida, JP· patent location history
2012–2015Patents assigned to FUKUYAMA HIROYA (4)· patent assignee history
2012Patents assigned to HIRATA TADASHI (1)· patent assignee history
2015Patents assigned to FUJINUMA KEN (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| OLYMPUS CORP | 20 | 2004–2021 |
| FUKUYAMA HIROYAself | 4 | 2012–2015 |
| OLYMPUS OPTICAL CO | 4 | 1993–2004 |
| FUJINUMA KEN | 1 | 2015 |
| HIRATA TADASHI | 1 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Machida, JP | 12 | 2007–2021 |
| Sagamihara, JP | 7 | 1994–2007 |
| Tokyo, JP | 5 | 1993–2019 |