LexDanaLexDanabeta
Inventor

Morio Ishihara

Inventor
Osaka, JP

Overview

21→
Patents
1991–2019
Patent span
Electricity
Primary field (CPC H)

Patents· 21 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H01Jprimary
H01JElectric discharge tubes or discharge lamps58%
C08JWorking-up10%
A41DOuterwear6%
C08FMacromolecular compounds obtained by reactions only involving carbon-to-carbon unsaturated bonds6%
B01JChemical or physical processes, e.g. catalysis or colloid chemistry3%
C08CTreatment or chemical modification of rubbers3%
C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients3%
C08LCompositions of macromolecular compounds3%
C09DCoating compositions, e.g. paints, varnishes or lacquers3%
Y10TTechnical subjects covered by former us classification3%
PatentTitleYear
10,392,477Method for manufacturing coagulated particles from latex prepared by emulsion polymerization, aggregates from latex prepared by emulsion polymerization, and coagulated particles from latex prepared by emulsion polymerization20198,937,113'Vinyl chloride resin aggregate particle, method for producing same, and gloves comprising same'20158,895,657'Vinyl chloride resin aggregate particles, process for producing same, and glove obtained using same'20148,237,112'Method and apparatus for time-of-flight mass spectrometry'20127,910,879'Method and apparatus for time-of-flight mass spectrometry'20117,504,620'Method and apparatus for time-of-flight mass spectrometry'20097,227,131'Time of flight mass spectrometer'20077,211,792'Mass spectrometer'20077,148,473'Time of flight mass spectrometer'20067,091,480'Method of determining mass-to-charge ratio of ions and mass spectrometer using the method'20067,038,198'Mass spectrometer'20066,949,736'Method of multi-turn time-of-flight mass analysis'20056,949,738'Mass spectrometer and method of determining mass-to-charge ratio of ion'20056,300,625'Time-of-flight mass spectrometer'20016,160,256'Time-of-flight mass spectrometer and mass spectrometric method sing same'20006,057,544'Mass spectrometer'20005,900,628'Method of processing mass spectrum'19995,118,939'Simultaneous detection type mass spectrometer'19925,107,110'Simultaneous detection type mass spectrometer'19925,051,593'Electrostatic multipole lens for charged-particle beam'19914,998,015'Mass spectrometer capable of multiple simultaneous detection'1991

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1991–2012Patents assigned to JEOL LTD (12)· patent assignee history
1991–1999Based in Tokyo, JP· patent location history
2000–2012Based in Osaka, JP· patent location history
2005–2007Patents assigned to UNIV OSAKA (4)· patent assignee history
2006–2007Patents assigned to SHIMADZU CORP (2)· patent assignee history
2006–2009Based in Toyonaka, JP· patent location history
2012–2015Patents assigned to ISHIHARA MORIO (3)· patent assignee history
2014–2019Patents assigned to KANEKA CORP (3)· patent assignee history
2014–2019Based in Takasago, JP· patent location history
2015Based in Hyogo, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
JEOL LTD121991–2012
UNIV OSAKA42005–2007
ISHIHARA MORIOself32012–2015
KANEKA CORP32014–2019
SHIMADZU CORP22006–2007
Locations
LocationPatentsSpan
Osaka, JP112000–2012
Tokyo, JP51991–1999
Takasago, JP22014–2019
Toyonaka, JP22006–2009
Hyogo, JP12015