Inventor

Takafumi Inoue

Inventor
Nagaokakyo, JP

Overview

31→
Patents
1997–2021
Patent span
Physics
Primary field (CPC G)

Patents· 31 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G06Fprimary
G06FElectric digital data processing20%
G06TImage data processing or generation, in general17%
G01NInvestigating or analysing materials by determining their chemical or physical properties9%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices8%
H01LSemiconductor devices4%
H10NElectric solid-state devices not otherwise provided for4%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h104%
G01LMeasuring force, stress, torque, work, mechanical power, mechanical efficiency, or fluid pressure3%
G06KGraphical data reading3%
H04LTransmission of digital information, e.g. telegraphic communication3%
PatentTitleYear
11,090,692Cleaning liquid supplying system, substrate processing apparatus and substrate processing system202110,710,011Filter and air-conditioning device202010,565,704Inspection method and inspection system202010,540,561Inspection method and inspection apparatus202010,481,701Operation input device201910,460,435Pattern inspection method and pattern inspection apparatus201910,419,277User identifying device, user identifying method, and user identifying program201910,281,415Pattern inspection method and pattern inspection apparatus201910,146,380Touch input device and mobile display device201810,120,485Electronic device and operation input program201810,120,486Display device that can be divided into multiple sections by user input and program for achieving the division201810,101,866Touch sensor having a hard coat layer201810,007,386Input device and program20189,922,415'Inspection method, inspection apparatus, and inspection system'20189,891,772'Touch input device and display device'20189,710,905'Mask inspection apparatus and mask inspection method'20179,690,414'Touch sensor having a pressure detecting sensor with an electrode non-forming section'20179,582,654'Mobile device, and authentication program'20179,575,608'Touch panel'20179,535,682'Method of determining whether input operation dialogue is displayable and computer system'20179,235,883'Inspection system and method'20169,202,270'Pattern inspection apparatus and pattern inspection method'20159,165,355'Inspection method'20159,057,711'Inspection apparatus and method'20158,903,158'Inspection system and inspection method'20148,861,832'Inspection system and method'20148,548,223'Inspection system and method'20138,213,703'Method and apparatus for reviewing defects on mask'20127,328,372'Process data collection system which reduces communication load for accessing data'20086,065,001'Information associating apparatus and method'20005,642,520'Method and apparatus for recognizing topic structure of language data'1997

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1997–2000Patents assigned to NIPPON TELEGRAPH & TELEPHONE (2)· patent assignee history
2000–2021Based in Tokyo, JP· patent location history
2012–2020Patents assigned to NUFLARE TECHNOLOGY INC (14)· patent assignee history
2012–2015Patents assigned to INOUE TAKAFUMI (4)· patent assignee history
2012–2017Based in Kanagawa, JP· patent location history
2013–2015Patents assigned to TSUCHIYA HIDEO (3)· patent assignee history
2017–2020Patents assigned to MURATA MANUFACTURING CO (11)· patent assignee history
2017–2020Based in Nagaokakyo, JP· patent location history
2018–2020Based in Chigasaki, JP· patent location history
2019Based in Setagaya, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
NUFLARE TECHNOLOGY INC142012–2020
MURATA MANUFACTURING CO112017–2020
INOUE TAKAFUMIself42012–2015
TSUCHIYA HIDEO32013–2015
NIPPON TELEGRAPH & TELEPHONE21997–2000
Locations
LocationPatentsSpan
Nagaokakyo, JP112017–2020
Kanagawa, JP92012–2017
Chigasaki, JP52018–2020
Tokyo, JP32000–2021
Setagaya, JP12019