Inventor
Max Funck
Inventor
Weimar, DE
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G02Bprimary
G02BOptical elements, systems or apparatus42%
G06TImage data processing or generation, in general25%
H04NPictorial communication, e.g. television25%
G03BApparatus or arrangements for taking photographs or for projecting or viewing them8%
PatentTitleYear
10,317,665Method for correcting illumination-dependent aberrations in a modular digital microscope, digital microscope and data-processing program201910,247,933Image capturing device and method for image capturing20199,652,847'Method for calibrating a digital optical imaging system having a zoom system, method for correcting aberrations in a digital optical imaging system having a zoom system, and digital optical imaging system'20179,344,650'Method for calibrating a digital optical instrument and digital optical instrument'20169,297,993'Ring illumination device for a microscope objective, and microscope objective'2016Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2016–2019Patents assigned to ZEISS CARL MICROSCOPY GMBH (5)· patent assignee history
2016–2019Based in Weimar, DE· patent location history
2019Based in Potsdam, DE· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ZEISS CARL MICROSCOPY GMBH | 5 | 2016–2019 |
Locations
| Location | Patents | Span |
|---|---|---|
| Weimar, DE | 4 | 2016–2019 |
| Potsdam, DE | 1 | 2019 |