LexDanaLexDanabeta
Inventor

Yonghang Fu

Inventor
Plano, TX, US

Overview

3→
Patents
2004–2009
Patent span
Physics
Primary field (CPC G)

Patents· 3 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties75%
G06TImage data processing or generation, in general25%
PatentTitleYear
7,539,583'Method and system for defect detection'20096,864,971'System and method for performing optical inspection utilizing diffracted light'20056,813,376'System and method for detecting defects on a structure-bearing surface using optical inspection'2004

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2004–2009Patents assigned to RUDOLPH TECHNOLOGIES INC (2)· patent assignee history
2004–2009Based in Plano, TX, US· patent location history
2005Patents assigned to ISOA INC (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
RUDOLPH TECHNOLOGIES INC22004–2009
ISOA INC12005
Locations
LocationPatentsSpan
Plano, Texas, US32004–2009